Chemical Analysis of Plasma‐treated Organic Surfaces and Plasma Polymers by Secondary Ion Mass Spectrometry

Delcorte, Arnaud; Cristaudo, Vanina; Zarshenas, Mohammad M.; Merche, Delphine; Reniers, François; Bertrand, Patrick

doi:10.1002/ppap.201500061

Cited by 10 publications

(6 citation statements)

References 70 publications

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“…[25][26][27][28] Recently, first time-of-flight SIMS (ToF-SIMS) studies were demonstrated to be promising for the in-depth characterization of plasma polymer multilayers or gradients. 29 Here, amino-and carboxylic acid-based polymers -of general interest for the design of bio-interfaces, 30,31 are considered. Various film designs including bilayers and microstructured films are presented.…”

Section: Introductionmentioning

confidence: 99%

Plasma polymer film designs through the eyes of ToF-SIMS

et al. 2018

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Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is increasingly used for the detailed chemical characterization of complex organic materials. Of particular interest in biointerface materials, it provides the accurate molecular information on their surface, a prerequisite for the understanding of subsequent interaction with biomaterials. Plasma polymer films are promising biointerface materials, as tuning the deposition parameters allows the control over film stability and density of surface functional groups. However, the optimization of these film properties not only requires a detailed characterization of the film chemistry, but also that of the deposition mechanisms. Here, ToF-SIMS is used within its different operation modes to investigate those on several plasma polymer film designs. The detailed information on surface molecular chemistry, interface conformation, vertical and lateral chemical and cross-linking gradients is gathered and linked to the underlying deposition mechanisms. In combination with other techniques, the interpretation and understanding of the final functional property of the films in terms of protein adsorption and site-specific binding is achieved.

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Section: Introductionmentioning

confidence: 99%

Plasma polymer film designs through the eyes of ToF-SIMS

et al. 2018

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“…Combined with principal component analysis (PCA), secondary ion mass spectrometry (SIMS) has proven to be a powerful method to determine the structure of plasma polymers and, in particular, to determine their crosslinking degree . Plasma polymers form very thin layers (<1 μm) with a complex crosslinked structure, and therefore, SIMS is one of the few tools able to access the chemical information …”

Section: Introductionmentioning

confidence: 99%

A quantitative determination of the polymerization of benzoxazine thin coatings by time‐of‐flight secondary ion mass spectrometry

Pospisilova

Renaud

Poorteman

et al. 2019

Surface & Interface Analysis

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Phenol-paraphenylenediamine (P-pPDA) benzoxazines exhibit excellent barrier properties, adequate to protect aluminum alloys from corrosion, and constitute interesting candidates to replace chromate-containing coatings in the aeronautical industry. For the successful application of P-pPDA coatings, it is necessary to decrease the curing temperature to avoid the delamination of the coating while preserving the mechanical properties of the alloy, as well as the barrier properties of the coating. However, decreasing the curing temperature leads to less polymerized films, the extent of which requires a quantitative assessment.While the conversion rate of the polymerization reaction is commonly evaluated for bulk samples using differential scanning calorimetry (DSC), a tool for its evaluation in thin films is missing. Therefore, a new approach was developed for that matter using time-of-flight secondary ion mass spectrometry (ToF-SIMS). The relation between the SIMS data integrated from inside thin films and the DSC results obtained on bulk samples with the same curing cycle allowed to calibrate the SIMS data. With this preliminary calibration of the technique, the polymerization of P-pPDA coatings can be locally determined, at the surface and along the depth of the coating, using dual-beam depth profiling with large argon cluster beam sputtering.

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“…In the plasma literature, a popular procedure for the surface characterization of plasma‐modified polymers is reported, that combines XPS (information about elements and chemical bonds), WCA (wettability of the surface related to the new grafted functionalities), and AFM (morphology) . In this context, ToF‐SIMS is an excellent complement, indispensable to elucidate the structural and chemical modifications of plasma‐treated polymers, not only at the surface (via the mass spectra), but also along the depth (via the molecular depth‐profiles) . The latter was recently possible using large argon gas cluster ion beams (GCIB) for sputtering.…”

Section: Introductionmentioning

confidence: 99%

“…[5,6] In this context, ToF-SIMS is an excellent complement, indispensable to elucidate the structural and chemical modifications of plasma-treated polymers, not only at the surface (via the mass spectra), but also along the depth (via the molecular depthprofiles). [15] The latter was recently possible using large argon gas cluster ion beams (GCIB) for sputtering. In these beams, each Ar n þ ion projectile is constituted by hundreds to thousands of atoms (n) and possesses an energy of few keV.…”

Section: Introductionmentioning

confidence: 99%

Molecular Surface Analysis and Depth-Profiling of Polyethylene Modified by an Atmospheric Ar-D₂O Post-Discharge

Cristaudo

Collette

Tuccitto

et al. 2016

Plasma Process. Polym.

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The injection of water vapor into ambient “open air” plasmas for the treatment of polymers represents a promising functionalization route for industrial and medical applications. The present study reports a scientist‐independent methodology, based on the ToF‐SIMS (time‐of‐flight secondary ion mass spectrometry) technique coupled with PCA/Wavelet‐PCA (principal component analysis), to probe the (sub) surface chemical/structural modifications induced by an atmospheric Ar‐D2O post‐discharge on low density polyethylene (LDPE) films as a function of two external plasma parameters, namely sample‐torch distance and treatment time. The SIMS characterization identifies two different families of samples (type I and II) as a function of time and distance. The highest reactivity of the D2O vapors with the LDPE films is achieved for times of few tens of seconds at a distance of 5 mm from the plasma source.

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Chemical Analysis of Plasma‐treated Organic Surfaces and Plasma Polymers by Secondary Ion Mass Spectrometry

Cited by 10 publications

References 70 publications

Plasma polymer film designs through the eyes of ToF-SIMS

Plasma polymer film designs through the eyes of ToF-SIMS

A quantitative determination of the polymerization of benzoxazine thin coatings by time‐of‐flight secondary ion mass spectrometry

Molecular Surface Analysis and Depth-Profiling of Polyethylene Modified by an Atmospheric Ar-D₂O Post-Discharge

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Chemical Analysis of Plasma‐treated Organic Surfaces and Plasma Polymers by Secondary Ion Mass Spectrometry

Cited by 10 publications

References 70 publications

Plasma polymer film designs through the eyes of ToF-SIMS

Plasma polymer film designs through the eyes of ToF-SIMS

A quantitative determination of the polymerization of benzoxazine thin coatings by time‐of‐flight secondary ion mass spectrometry

Molecular Surface Analysis and Depth-Profiling of Polyethylene Modified by an Atmospheric Ar-D2O Post-Discharge

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Product

Resources

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Molecular Surface Analysis and Depth-Profiling of Polyethylene Modified by an Atmospheric Ar-D₂O Post-Discharge