Chemical information from Auger data using factor analysis: Some examples

Chemelli, C.

doi:10.1002/sia.740220116

Cited by 8 publications

(1 citation statement)

References 13 publications

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“…Theoretically, as more of the raw data are used to estimate the composition, better precision in the composition determination should be possible. This approach has been pursued and extended by several authors who have studied, for example, oxidation states at interfaces (Chemelli 1994;Kooi & Somers 1994), the composition of alloys with overlapping Auger features in their spectra (Calliari et al 1994) and the analysis of carbides and nitrides (Reniers et al 1994). It is an extremely powerful approach for the extraction of the maximum amount of useful information from a set of Auger spectra.…”

Section: F Actor and Ta R G E T Factor A N A Ly Sismentioning

confidence: 99%

Multi-imaging and multivariate statistics used for 3D characterization at surfaces

Prutton

Barkshire

Kenny

et al. 1996

Phil. Trans. R. Soc. Lond. A

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Section: F Actor and Ta R G E T Factor A N A Ly Sismentioning

confidence: 99%

Multi-imaging and multivariate statistics used for 3D characterization at surfaces

Prutton

Barkshire

Kenny

et al. 1996

Phil. Trans. R. Soc. Lond. A

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Investigations on Nanoscale Multilayers by Analytical TEM in Scanning Mode

Thomas

Bauer

Baunack

et al. 2000

Cryst. Res. Technol.

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Nanoscale multilayers show properties completely different from bulk materials and are of great interest in the modern materials science. The characterisation of their structure and composition requires methods with spatial resolution of only few nanometers. The analytical transmission electron microscopy on cross sections is one of the most suitable methods. Imaging and spectroscopy of the same specimen details lead to essential information about correlation of structure and properties. The use of the analytical TEM with possibilities and limitations in the scanning mode will be demonstrated on four materials problems: oxygen bond in thin resistivity films (CuNi/NiCr), hard coating multilayers (TiN/Al2O3), and Fe/Al multilayers, as well as the degree of mixing within nanoscale Co/Cu multilayers.

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Factor analysis applied to the study of valence band resonant photoemission spectra in transition‐metal compounds

Sánchez‐Agudo

Soriano

Trigo

et al. 2002

Surface & Interface Analysis

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We have applied factor analysis to the study of the valence band resonant photoemission spectra of a TiO 2 thin film. Classical analysis of the photoemission spectra as a function of the photon energy through the Ti 2p → 3d absorption edge does not give a clear understanding of the resonant process, because the resonance phenomenon is present along the valence band and the only differences on the resonance are related to the distribution of cationic d-states. However, factor analysis of the spectra allows a more quantitative analysis of the resonance phenomena. Analysis of the RPES spectra is not always an easy task. The most common analysis involves a plot of the intensities of the main structures in the valence band as a function of the photon energy to obtain constant initial state (CIS) curves. However, the CIS curves obtained by this method do not always give a clear understanding of the resonance process. In general, the different features in the valence band are of mixed cationic-anionic character due to hybridization. This mixed character leads to the fact that all the features show a similar CIS spectrum except for the difference in enhancement, which is proportional to the contribution of the cationic d-states to the different features analysed. The main purpose of this paper is to apply factor analysis to analyse the valence band resonant photoemission spectra in transition-metal compounds. To this end, and as an example, we present an analysis of the 2p ! 3d valence band resonant photoemission spectra of a TiO 2 thin film and show how factor analysis gives a satisfactory explanation of the resonant photoemission in TiO 2 , allowing experimental cross-sections of the Ti 3d states in the corresponding energy range to be determined. For comparison, we have included a classical analysis to show the mixed character of the different resonant profiles (i.e. CIS spectra) at several binding energies within the valence band.Factor analysis is a multivariative statistical method that has been used as a standard method of data handling in analytical chemistry, 2 mainly in the analysis of Auger Factor analysis applied to photoemission 245 and core-level photoelectron spectra. 3 -7 Studies using factor analysis of the valence band structure are very scarce. To our knowledge, factor analysis has been applied only to the study of the electronic structure of SnO 8 and TiN. 9Factor analysis allows the determination of the number of principal components, which can be combined linearly to represent a sequence of experimental spectra, as well as their concentrations as a function of photon energy. This property supports the use of factor analysis for resonant photoemission spectra. Rutile (TiO 2 ) has been studied already by resonant photoemission at the 3p ! 3d edge 10 -12 and at the 2p ! 3d edge 13 -15 using the classical method. It is worth noting that, as observed by Prince et al., 13 resonance effects at the L 2,3 edge give much higher intensity than for the M 2,3 edge, so we have chosen the 2p ! 3d edge for facto...

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Chemical information from Auger data using factor analysis: Some examples

Cited by 8 publications

References 13 publications

Multi-imaging and multivariate statistics used for 3D characterization at surfaces

Multi-imaging and multivariate statistics used for 3D characterization at surfaces

Investigations on Nanoscale Multilayers by Analytical TEM in Scanning Mode

Factor analysis applied to the study of valence band resonant photoemission spectra in transition‐metal compounds

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