In this study, the K shell natural line widths with K1 and K2 X-ray line widths of Ti, V, Cr, Mn, Fe, Co, Ni, Cu and Zn elements and compounds were semi-experimentally calculated by using the values of K shell fluorescence yield. An 241 Am radioisotope source, emitting in 75 mCi intensity and 59.5 keV energy gamma rays was used to stimulate the samples. A solid state Si(Li) detector have a resolution 155 eV at 5.96 keV, was used to count K X-rays emitted from the specimens. It was determined that the X-ray line widths of ΓK1 and ΓK2 and the natural line width of the ΓK K level vary depending on the chemical structure. The results show that ΓK, ΓK1 and ΓK2 line widths measured in compounds deviated up to 5-48% from according to values of the pure element. The present results, for pure elements, are in good agreement with the results of other researchers in the literature within the limits of error.