2019
DOI: 10.1002/smll.201903663
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Chemical Solution Route for High‐Quality Multiferroic BiFeO3 Thin Films

Abstract: Bismuth ferrite (BiFeO3) has recently become interesting as a room‐temperature multiferroic material, and a variety of prototype devices have been designed based on its thin films. A low‐cost and simple processing technique for large‐area and high‐quality BiFeO3 thin films that is compatible with current semiconductor technologies is therefore urgently needed. Development of BiFeO3 thin films is summarized with a specific focus on the chemical solution route. By a systematic analysis of the recent progress in … Show more

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Cited by 47 publications
(27 citation statements)
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“…Figure 3 a shows the image of the etched area by detecting Bi + and Fe + ions, the arrows show the places where these elements were mixed prior to the BFO phase: it is interesting that this phase was mainly formed on the surface of more exfoliated film sections, probably associated with oxidative reactions with the partial emission of carbon oxides. In the near-surface region, where the amount of Bi - prevails (green areas of Figure 3 ), the structure of Bi 1+x FeO 3 (x > 1) is formed [ 44 ]. There is a number of formal oxidation states displayed by bismuth in its oxides, in particular 3 + (Bi 2 O 3 ) and 5 + (Bi 2 O 5 ) (and mixed valence states 3/5 + (Bi 2 O 4 , Bi 4 O 7 )).…”
Section: Resultsmentioning
confidence: 99%
“…Figure 3 a shows the image of the etched area by detecting Bi + and Fe + ions, the arrows show the places where these elements were mixed prior to the BFO phase: it is interesting that this phase was mainly formed on the surface of more exfoliated film sections, probably associated with oxidative reactions with the partial emission of carbon oxides. In the near-surface region, where the amount of Bi - prevails (green areas of Figure 3 ), the structure of Bi 1+x FeO 3 (x > 1) is formed [ 44 ]. There is a number of formal oxidation states displayed by bismuth in its oxides, in particular 3 + (Bi 2 O 3 ) and 5 + (Bi 2 O 5 ) (and mixed valence states 3/5 + (Bi 2 O 4 , Bi 4 O 7 )).…”
Section: Resultsmentioning
confidence: 99%
“…PLD and RF sputtering were demonstrated to produce high-quality epitaxial BFO films with a small concentration of the structural defects and low leakage current [10,12]. On the other hand, chemical solution deposition (CSD) is of great interest because it is more suitable commercially, cheaper and makes it possible to cover large-scale wafers [14,15]. Nevertheless, CSD films are not very reproducible in their ferroelectric properties and possess a high value of leakage current impeding their further implementation in the devices [14].…”
Section: Introductionmentioning
confidence: 99%
“…Unlike PLD and RF sputtering deposition techniques, the CSD pathway is realized in the three-step annealing procedure: gelation step at lower temperatures (70-300 • C), pyrolysis (300-350 • C), and crystallization step at high temperatures (450-750 • C) [15]. The leakage current in CSD films is significantly higher than in thin films produced by RF sputtering and PLD, which are denser and possess more stoichiometric composition [14]. This difference is caused by the long-time low-temperature treatment that affects the inter-particle diffusion between Fe 2 O 3 and Bi 2 O 3 , resulting in the formation of either pure-phase BiFeO 3 or secondary phases, typically, sillenite-like Bi 25 FeO 39 and mullite-like Bi 2 Fe 4 O 9 [16,17].…”
Section: Introductionmentioning
confidence: 99%
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