1996
DOI: 10.1016/0925-9635(96)00527-4
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Chemical sputtering of carbon films by low energy N2+ ion bombardment

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Cited by 89 publications
(42 citation statements)
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References 23 publications
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“…The data shown in Figure 1 are not yet adequate for investigation of the ion energy dependence of Y(C/N), and hence a mean critical value of R(I/A) at which the film formation begins to cease can be estimated to be equal to 0.21 in our case. The value estimated in this study for the Y(C/N) is in line with that obtained by Hammer and Gissler, 8 implying that the contribution of physical sputtering is small.…”
Section: Resultssupporting
confidence: 80%
See 1 more Smart Citation
“…The data shown in Figure 1 are not yet adequate for investigation of the ion energy dependence of Y(C/N), and hence a mean critical value of R(I/A) at which the film formation begins to cease can be estimated to be equal to 0.21 in our case. The value estimated in this study for the Y(C/N) is in line with that obtained by Hammer and Gissler, 8 implying that the contribution of physical sputtering is small.…”
Section: Resultssupporting
confidence: 80%
“…6 Assuming that physical sputter is negligible owing to low ion energies, they estimated that the chemical sputtering yield Y(C/N), defined by the ratio of the number of sputtered carbon atoms to that of incident atomic nitrogen in the ion beam, is equal to 0.25 ± 0.05. 6,8 The higher the R(I/A), the stronger the formation rate of volatile CN compounds and, consequently, the film formation ceases. The data shown in Figure 1 are not yet adequate for investigation of the ion energy dependence of Y(C/N), and hence a mean critical value of R(I/A) at which the film formation begins to cease can be estimated to be equal to 0.21 in our case.…”
Section: Resultsmentioning
confidence: 99%
“…chemical sputtering could account for the observed reduction of the net deposition rates. There are many hints in the literature that chemical sputtering plays an important role in the interaction of nitrogen containing hydrocarbon plasmas with a-C:H surfaces [12][13][14][15][16][17].…”
Section: Introductionmentioning
confidence: 99%
“…If the radical is formed in sublayers, C 2 N 2 molecule is created [60]. In the case of nitrogen plasma of hydrocarbon film, we can also observe erosion of the surface and formation CN radicals.…”
Section: Reactive Etching/plasma Treatment By Gases Containing Nitrogenmentioning
confidence: 86%