Chemical state analysis employing sub‐natural linewidth resolution PIXE measurements of Kα diagram lines

Kavčič, M.; Karydas, A. G.; Zarkadas, Ch.

doi:10.1002/xrs.822

Cited by 32 publications

(8 citation statements)

References 21 publications

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“…At the Kα-line a small energy shift in dependence of the binding form can be observed when spectrometers with an extremely good angle resolution are used [35].…”

Section: Xrf-analysismentioning

confidence: 99%

Studies on the influence of H 2 S and SO 2 on the activity of a PdO/Al 2 O 3 catalyst for removal of oxygen by total oxidation of (bio-)methane at very low O 2 :CH 4 ratios

Ortloff

Bohnau

Kramar

et al. 2016

Applied Catalysis B: Environmental

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This work focuses on the deactivation and in-situ regeneration effects of a commercial PdO/Al 2 O 3 catalyst for removal of oxygen by oxidation of CH 4 at low O 2 :CH 4 ratios when hydrogen sulfide and sulfur dioxide are applied. The experimental work is carried out at an operating temperature range of 200 °C < T < 300 °C, atmospheric pressures and H 2 S contents of < 50 ppmv. SO 2 and H 2 S show a different behavior in the examined range of operating conditions. Due to the low operating temperatures and low oxygen contents applied in this work, it was possible to identify an intermediate species, presumably PdSO 3 , with an increased activity for the oxidation of methane. This stands in contrast to the literature, where SO 2 typically causes catalyst deactivation. Based on the experimental results, a reaction scheme was derived and kinetic measurements for each of the participating reactions were carried out separately.

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“…At the Kα-line a small energy shift in dependence of the binding form can be observed when spectrometers with an extremely good angle resolution are used [35].…”

Section: Xrf-analysismentioning

confidence: 99%

Studies on the influence of H 2 S and SO 2 on the activity of a PdO/Al 2 O 3 catalyst for removal of oxygen by total oxidation of (bio-)methane at very low O 2 :CH 4 ratios

Ortloff

Bohnau

Kramar

et al. 2016

Applied Catalysis B: Environmental

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“…[34][35][36][37] These spectrometers were all built in the latter half of the twentieth century and required multi-kW x-ray tubes to achieve reasonable measurement times. More recent laboratory-based work in this energy range has seen an impressive extension to protoninduced x-ray emission analysis, 38,39 with the same Rowlandcircle instrument also seeing important use at a synchrotron endstation. 17,18,40 Here we present technical details and representative results for a dispersive x-ray emission spectrometer designed a) Author to whom correspondence should be addressed: seidler@uw.edu to function particularly well in this 2-2.5 keV energy range and demonstrate measurements on S and P XES both in the laboratory and at a synchrotron endstation.…”

Section: Introductionmentioning

confidence: 99%

A compact dispersive refocusing Rowland circle X-ray emission spectrometer for laboratory, synchrotron, and XFEL applications

Holden

Hoidn

Ditter

et al. 2017

Review of Scientific Instruments

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Articles you may be interested inCCD camera as feasible large-area-size x-ray detector for x-ray fluorescence spectroscopy and imaging Review of Scientific Instruments 88, 063703 (2017) (Received 25 April 2017; accepted 6 July 2017; published online 27 July 2017) X-ray emission spectroscopy is emerging as an important complement to x-ray absorption fine structure spectroscopy, providing a characterization of the occupied electronic density of states local to the species of interest. Here, we present details of the design and performance of a compact x-ray emission spectrometer that uses a dispersive refocusing Rowland (DRR) circle geometry to achieve excellent performance for the 2-2.5 keV range, i.e., especially for the K-edge emission from sulfur and phosphorous. The DRR approach allows high energy resolution even for unfocused x-ray sources. This property enables high count rates in laboratory studies, approaching those of insertion-device beamlines at third-generation synchrotrons, despite use of only a low-powered, conventional x-ray tube. The spectrometer, whose overall scale is set by use of a 10-cm diameter Rowland circle and a new small-pixel complementary metal-oxide-semiconductor x-ray camera, is easily portable to synchrotron or x-ray free electron laser beamlines. Photometrics from measurements at the Advanced Light Source show excellent overall instrumental efficiency. In addition, the compact size of this instrument lends itself to future multiplexing to gain large factors in net collection efficiency or its implementationincontrolledgasgloveboxeseitherinthelaborinanendstation.

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“…3 Kavčič et al achieved a subnatural linewidth resolution in their PIXE system by combining a Johansson-type crystal spectrometer and an x-ray charge coupled device ͑CCD͒ camera. 4 They demonstrated the applicability of their system to the chemical state identification of sulfur contained in an aerosol sample.…”

Section: Introductionmentioning

confidence: 98%

Development of a high-efficiency high-resolution particle-induced x-ray emission system for chemical state analysis of environmental samples

Hasegawa

Tada²,

Oguri³

et al. 2007

Review of Scientific Instruments

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We have developed a high-efficiency high-resolution particle-induced x-ray emission (PIXE) system employing a von Hamos-type crystal spectrometer for a chemical state identification of trace elements in environmental samples. The energy resolution of the system was determined to be about 0.05% through the observation of Si Kalpha(1,2) x rays (1.74 keV) from elemental silicon. The throughput efficiency of the system was also evaluated quasitheoretically to be 1.6x10(-7) counts/incident proton for Si Kalpha(1,2) emission. To demonstrate a chemical state analysis using the high-resolution PIXE system, Si Kalpha(1,2) and Kbeta x-ray spectra for SiC, Si(3)N(4), and SiO(2) were measured and compared. The observed chemical shifts of the Si Kalpha(1,2) peaks for SiC, Si(3)N(4), and SiO(2) relative to elemental silicon were 0.20, 0.40, and 0.55 eV, respectively. The tendency of these shifts were well explained by the effective charges of the silicon atoms calculated by a molecular orbital method.

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Chemical state analysis employing sub‐natural linewidth resolution PIXE measurements of Kα diagram lines

Cited by 32 publications

References 21 publications

Studies on the influence of H 2 S and SO 2 on the activity of a PdO/Al 2 O 3 catalyst for removal of oxygen by total oxidation of (bio-)methane at very low O 2 :CH 4 ratios

Studies on the influence of H 2 S and SO 2 on the activity of a PdO/Al 2 O 3 catalyst for removal of oxygen by total oxidation of (bio-)methane at very low O 2 :CH 4 ratios

A compact dispersive refocusing Rowland circle X-ray emission spectrometer for laboratory, synchrotron, and XFEL applications

Development of a high-efficiency high-resolution particle-induced x-ray emission system for chemical state analysis of environmental samples

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