Details of the chemistry enabling
the patterning of organotin photoresists
to single-digit-nm resolution continue to engage study. In this report,
we examine the contributions of atmospheric gases to the differential
dissolution rates of an n-butyltin oxide hydroxide
photoresist. Cryo scanning tunneling electron microscopy (cryo-STEM)
produces a micrograph of the latent image of an irradiated resist
film, readily distinguishing exposed and unexposed regions. Temperature-programmed
desorption mass spectrometry (TPD-MS) and cryo electron energy loss
spectroscopy (cryo-EELS) show that irradiated films are depleted in
carbon through desorption of butane and butene. Upon aging in air,
irradiated films absorb H2O, as previously established.
TPD-MS also reveals a previously unrecognized absorption of CO2, which correlates to a heightened dissolution contrast. This
absorption may play an active role in determining intrinsic patterning
performance and its variability based on changes in atmospheric-gas
composition.