1993
DOI: 10.1002/chin.199331282
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ChemInform Abstract: Advanced Metal Oxide Semiconductor and Bipolar Devices on Bonded Silicon‐on‐Insulators

Abstract: ChemInform is a weekly Abstracting Service, delivering concise information at a glance that was extracted from about 100 leading journals. To access a ChemInform Abstract of an article which was published elsewhere, please select a “Full Text” option. The original article is trackable via the “References” option.

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(2 citation statements)
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“…Particularly, for fabricating a silicon-on-insulator (SOI) wafer by the wafer-bonding technique using two silicon wafers [4][5][6][7], a very clean and flat surface of silicon dioxide film for the buried oxide layer is necessary.…”
Section: Introductionmentioning
confidence: 99%
“…Particularly, for fabricating a silicon-on-insulator (SOI) wafer by the wafer-bonding technique using two silicon wafers [4][5][6][7], a very clean and flat surface of silicon dioxide film for the buried oxide layer is necessary.…”
Section: Introductionmentioning
confidence: 99%
“…A(R)= -7x10 -6 R 2 -6x10 -4 R -5x10 -2 , and [4] B(R)=2x10 -3 R 2 + 2x10 -2 R + 20. [5] In the center region, the etching rate is simply assumed to a constant value, C,…”
Section: Resultsmentioning
confidence: 99%