ChemInform Abstract: Effect of Film Thickness on the Magnetic Properties of Electroless Cobalt Alloy Plating Films for Perpendicular Magnetic Recording Media.

Koiwa, Ichiro; Toda, Miki; Osaka, Tetsuya

doi:10.1002/chin.198629006

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“…Typical data of perpendicular coercivity, H,. (• already discussed in the previous paper (10), are shown in Fig. 1 as a function of the film thickness.…”

Section: * Electrochemical Society Active Membermentioning

confidence: 55%

“…E]ectroless cobalt alloy films were plated from an ammoniacal mixed complexing-agent bath: ammoniacal malonate-tartrate-succinate complexing-agent bath for Co-Ni-Re-Mn-P (8, 10) and ammoniacal malonate-tartratetartronic acid-gluconate complexing-agent bath for Co-Ni-Re-P (9,10). The compositions and operating conditions for both baths, which are the same as those reported in previous research (10), are listed in Table I. Composition analyses of films using a 0.50 ~m film plated on a copper sheet have already been reported (10).…”

Section: Methodsmentioning

confidence: 99%

“…The compositions and operating conditions for both baths, which are the same as those reported in previous research (10), are listed in Table I. Composition analyses of films using a 0.50 ~m film plated on a copper sheet have already been reported (10). Polished electroless Ni-P film plated on A1 alloy was used as a substrate for the investigation (5)(6)(7)(8)(9)(10).…”

Section: Methodsmentioning

confidence: 99%

“…The authors earlier reported electroless cobalt alloy films for perpendicular magnetic recording media and also discussed their read/write characteristics (5)(6)(7)(8)(9)(10). In these research works, it was found that there were two kinds of electroless magnetic films whose magnetic properties displayed quite different degrees of thickness dependence (8,10). Typical data of perpendicular coercivity, H,.…”

Section: * Electrochemical Society Active Membermentioning

confidence: 99%

“…1 as a function of the film thickness. In the above paper (10), the thickness dependence of magnetic properties was discussed from the viewpoint of perpendicular magnetic recording medium applications. The present paper describes further investigations of the correlation between magnetic properties and crystal structure as a function of film thickness and discusses the origin of the difference between Co-Ni-Re-iVIn-P and Co-Ni-Re-P alloy films.…”

Section: * Electrochemical Society Active Membermentioning

confidence: 99%

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The Structure of Electroless Cobalt Alloy Films for Perpendicular Magnetic Recording Media

Koiwa

Matsubara

Osaka

et al. 1986

J. Electrochem. Soc.

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Two types of electroless Co alloy films, Co40.1‐Ni44.2‐Re6.0‐P9.7 and Co23.6‐Ni58.5‐Re5.3‐Mn0.2‐P12.4 , were prepared for perpendicular magnetic recording media. The correlation between their structure and magnetic properties was investigated and discussed as a function of film thickness. The magnetic properties of these two types of films showed different patterns of dependence with respect to the film thickness. The Co‐Ni‐Re‐P alloy film gave a higher Hnormalcfalse(⊥false) (perpendicular coercivity) in regions where it was very thin; on the other hand, the Co‐Ni‐Re‐Mn‐P alloy film displayed a lower Hnormalcfalse(⊥false) at the initial film thickness. The composition was observed with AES measurements to be nearly independent of film thickness. The clear columnar structure of both types of films was confirmed by scanning electron microscopy (SEM) and especially by transmission electron microscopy (TEM) observations. Only the reflection high energy electron diffraction (RHEED) patterns for both types of film clearly showed different dependence patterns with respect to the film thickness. The Co‐Ni‐Re‐P film displayed a very highly c‐axis oriented structure even at the initial thin film stage. On the other hand, the Co‐Ni‐Re‐Mn‐P film showed a dependence of the degree of c‐axis orientation on the film thickness, which increased with film thickness. The differences in magnetic properties as a function of thickness were assumed to be due to the degrees of c‐axis orientation and change in magnetic domain structure.

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“…Typical data of perpendicular coercivity, H,. (• already discussed in the previous paper (10), are shown in Fig. 1 as a function of the film thickness.…”

Section: * Electrochemical Society Active Membermentioning

confidence: 55%