Abstract:With the continuous drive toward integrated circuits (ICs) scaling, more test patterns are required in testing. However, the large number of patterns continues to increase test time and test costs. Thus, test costs of ICs are becoming more crucial yet more challenging. In this paper, we propose a novel adaptive test strategy to reduce test costs without increasing test escape, and using shortest path first (SPF) algorithm combined with K-Nearest Neighbor (KNN) to reorder the test patterns. The patterns which i… Show more
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