MOEMS and Miniaturized Systems XX 2021
DOI: 10.1117/12.2582707
|View full text |Cite
|
Sign up to set email alerts
|

CMOS compatible MEMS pyroelectric infrared detectors: from AlN to ScAlN

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1

Citation Types

0
10
0

Year Published

2021
2021
2023
2023

Publication Types

Select...
5
1
1

Relationship

1
6

Authors

Journals

citations
Cited by 10 publications
(10 citation statements)
references
References 0 publications
0
10
0
Order By: Relevance
“…The absorption of ∼50% for the 20% ScAlN-based pyroelectric detector with AOGs is lower than that of the 12% ScAlN-based pyroelectric detector previously reported with absorption ∼75% 3,29,36 but higher than that of AlN-based pyroelectric detector which reports absorption ∼25%. 30,36 The high reflection at the ∼4 μm wavelength region which causes lower absorption in the same wavelength region could be caused by the rougher surface 37 of the detector stack (as observed from Figure 2b previously) mainly attributed by the AOGs in the 20% ScAlN layer that induces the rough interface between the ScAlN layer and TiN (as observed from Figure 2c and d previously).…”
mentioning
confidence: 62%
See 2 more Smart Citations
“…The absorption of ∼50% for the 20% ScAlN-based pyroelectric detector with AOGs is lower than that of the 12% ScAlN-based pyroelectric detector previously reported with absorption ∼75% 3,29,36 but higher than that of AlN-based pyroelectric detector which reports absorption ∼25%. 30,36 The high reflection at the ∼4 μm wavelength region which causes lower absorption in the same wavelength region could be caused by the rougher surface 37 of the detector stack (as observed from Figure 2b previously) mainly attributed by the AOGs in the 20% ScAlN layer that induces the rough interface between the ScAlN layer and TiN (as observed from Figure 2c and d previously).…”
mentioning
confidence: 62%
“…On the other hand, the reflection spectrum shows high reflection in the ∼4 μm wavelength region. This will subsequently affect the absorption intensity at the same wavelength region, as absorption is calculated by subtracting the measured FTIR transmission and reflection spectra across wavelengths in the range 2–14 μm from 100%. ,, …”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…On the other hand, PDs are widely used in the IR range and are produced by industry. Today IR PDs are one of the best devices in uncooled IR detectors, providing a high efficiency of detection of the illuminating radiation, relative short response time, high signal-to-noise ratio, low cost, and high reliability [22][23][24][25].…”
Section: Introductionmentioning
confidence: 99%
“…Moreover, the present PD, designed especially for THz range, is expensive and lacks reliability. Presently, PDs are one of the most used devices in uncooled IR detectors, providing a high efficiency of detection of the illuminated radiation, relative short response time, high signal-to-noise ratio, low cost, and high reliability [24][25][26][27].…”
Section: Introductionmentioning
confidence: 99%