1988
DOI: 10.1016/0022-0248(88)90625-2
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Code: A novel MOVPE technique for the single stage growth of buried ridge double heterostructure lasers and waveguides

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Cited by 40 publications
(4 citation statements)
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“…[1][2][3] III-V compound semiconductors are grown on nonplanar or SiO 2 masked substrates. This technique is very attractive because of the high degree of freedom in the design of advanced devices.…”
Section: Introductionmentioning
confidence: 99%
“…[1][2][3] III-V compound semiconductors are grown on nonplanar or SiO 2 masked substrates. This technique is very attractive because of the high degree of freedom in the design of advanced devices.…”
Section: Introductionmentioning
confidence: 99%
“…We have performed systematic investigations in this field since the growth mechanism of InP on contoured substrates are not known in detail, e.g., depending largely on the dimensions of the corrugation. [12][13][14] We obtain high interface quality and a minimum planarization of the V-groove tip at low growth temperature (T G ϭ500°C͒ and at a high V/III ratio ͑2800͒.…”
mentioning
confidence: 97%
“…It has been found [31] that, at least under some growth conditions, InGaAs and InAlAs do not grow on { l l l}A/B, while InP does. This behaviour has been used to fabricate, in a single step, buried ridge double-heterostructure InGaAs/InP lasers, by growth on [OlT]oriented ridges, and buried ridge InGaAspnAlAs waveguides by growth on [Olll-or [OlTI-oriented ridges defined in (100) InP substrates [31].…”
mentioning
confidence: 99%
“…It has been found [31] that, at least under some growth conditions, InGaAs and InAlAs do not grow on { l l l}A/B, while InP does. This behaviour has been used to fabricate, in a single step, buried ridge double-heterostructure InGaAs/InP lasers, by growth on [OlT]oriented ridges, and buried ridge InGaAspnAlAs waveguides by growth on [Olll-or [OlTI-oriented ridges defined in (100) InP substrates [31]. However, the performances of the devices have been poor, probably due to composition deviation and dislocation generation which can occur in these materials systems, as w i l l be elaborated below.…”
mentioning
confidence: 99%