Diamond is considered the ultimate semiconductor for
its excellent
physical and chemical properties, while the defects formed during
the growth significantly limit the performance of diamond devices.
Online monitoring and fixing is an effective method to minimize the
defect density in diamond crystals. The existing methods fail to effectively
investigate diamond crystals during growth due to the low frame rate
or the limited variety of parameters. Here, we employ optical time-stretch
quantitative phase imaging (OTS-QPI) to investigate the multiple parameters
of diamond crystals synthesized in different situations. Specifically,
we measure the morphological features, surface fluctuations, and refractive
index distributions of diamond plates grown via chemical vapor deposition
in different growth modes or via high-pressure high-temperature in
doping with various concentrations of boron, respectively. The results
indicate that the morphological features, surface fluctuations, and
refractive index distributions acquired with OTS-QPI show an accuracy
that agrees well with those captured by commercial devices, including
a microscope, an optical profiler, and an ellipsometer. This work
indicates that OTS-QPI can perform online measurements of multiple
parameters of diamond crystals at a high speed and high accuracy,
which can potentially be employed to increase the quality and yield
rate of diamond devices.