“…A much higher intensity can be achieved via coherent emission, i.e., the longitudinal dimension of an ultra-short bunch is smaller than the CR wavelength, which can be achieved by a laser slicing or deliberately induced microbunching in the SXR wavelength range [13][14][15]. On the other hand, CR in SXR region can be used for transverse beam size and emittance diagnostics to reduce the diffraction limit [16,17] and to minimise the effect of the coherent radiation contribution [18,19] at, for example, an XFEL facility.…”