“…XMCD involves measuring the difference in the absorption of left and right circularly polarized X-rays by a magnetically ordered material. Utilization of the XAS and XMCD techniques can reveal the evolution of the electronic structure and magnetic properties across the phase transition, and is thereby especially suitable for the phonon-electron-magnon coupled MCMs such as Gd 5 (Si 2 Ge 2 ), [339] (Mn,Fe) 2 (P,X)-based compounds (X = As, Ge, Si), [340][341][342][343] La(Fe,Si) 13 -based materials, [175,344] NiMn-X based magnetic Heusler compounds (X = Ga, In, Sn, Sb), [345][346][347][348] FeRh, [349,350] Mn 3 XC (X = Ga, Sn) based antiperovskites, [351] Mn-M-X (M = Co, Ni and X = Si, Ge), [352,353] Laves phase compounds, [354,355] GdNi alloys. [356] Recent advances in the application of synchrotron XAS and XMCD techniques on MCMs are summarized below:…”