Combination of structural and state analysis for partial scan

Sharma, Sanjay; Hsiao, Michael S.

doi:10.1109/icvd.2001.902652

Cited by 12 publications

(3 citation statements)

References 25 publications

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“…Increased sequential depth in partial scans contributes to increasing the TAT. Various categories of partial scan compression techniques have been developed, namely, testability analysis [2], test pattern generation [2][3][4][5], structural analysis [2][3][4][5], hybrid approaches [2][3][4][5][6][7], layout driven [8], timing and retiming driven [9,10], and order scan cells or reset sequence based [11].…”

Section: Partial Scanmentioning

confidence: 99%

Aggressive Exclusion of Scan Flip-Flops from Compression Architecture for Better Coverage and Reduced TDV: A Hybrid Approach

Shantagiri

Kapur

2019

JLPEA

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Scan-based structural testing methods have seen numerous inventions in scan compression techniques to reduce TDV (test data volume) and TAT (test application time). Compression techniques lead to test coverage (TC) loss and test patterns count (TPC) inflation when higher compression ratio is targeted. This happens because of the correlation issues introduced by these techniques. To overcome this issue, we propose a new hybrid scan compression technique, the aggressive exclusion (AE) of scan cells from compression for increasing overall TC and reduce TPC. This is achieved by excluding scan cells which contribute to 12% to 43% of overall care bits from compression architecture, placing them in multiple scan chains with dedicated scan-data-in and scan-data-out ports. The selection of scan cells to be excluded from the compression technique is done based on a detailed analysis of the last 95% of the patterns from a pattern set to reduce correlations. Results show improvements in TC of up to 1.33%, and reductions in TPC of up to 77.13%.

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Section: Partial Scanmentioning

confidence: 99%

Aggressive Exclusion of Scan Flip-Flops from Compression Architecture for Better Coverage and Reduced TDV: A Hybrid Approach

Shantagiri

Kapur

2019

JLPEA

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“…The consequent benefit is potential alleviation of the performance penalty of scan, in addition to other benefits such as test time, data volume and power reduction. The previously proposed techniques in partial scan can be classified mainly into three categories: structure-based techniques that typically involves breaking the cycles and/or reducing scan depth [1,2,3,4,5,6,7,8,9,10,11], testabilitybased techniques that select scan flip-flops based on testability improvements [5,6,12,13,14,15,16,17,18,19,20,21], and test generation-based techniques which intertwine test generation and scan flip-flop selection [22,23,24,25,26,27]. Other partial scan techniques include those driven by layout constraints [5], timing constraints [28], re-timing [2,29], and toggling rate of flip-flops and entropy measures [30].…”

Section: Introductionmentioning

confidence: 99%

Eliminating Performance Penalty of Scan

Sinanoglu

2012

2012 25th International Conference on VLSI Design

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Stringent performance requirements magnify the performance degradation impact of Design-for-Testability (DfT) techniques. As more aggressive performance optimizations are being employed, resulting in high-performance designs with reduced logic depth, the impact of scan multiplexers is becoming even more magnified. In this work, we propose a scan cell transformation technique that transfers the scan multiplexer delay from the input of the flip-flop to its output, enabling the removal of the scan multiplexer delay off the critical paths. By inserting a few shadow flip-flops properly, the proposed transformation technique retains test development (test data, quality, etc.) and application (test time, power dissipation, etc.) intact, fully complying with the conventional design and test flow. Experimental results justify the efficacy of the proposed techniques in eliminating the performance penalty of scan quickly and cost-effectively, and thus in enhancing functional speed of integrated circuits.

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“…Partial-scan mthods can be categorized as: structure based [7][8][9][10][11], testability-measure based [12], and test-generation based [13] methods. Of the three, structure based methods have been most successful.…”

Section: Introductionmentioning

confidence: 99%