2002
DOI: 10.1016/s0040-6090(02)00205-5
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Combinatorial studies of Zn-Al-O and Zn-Sn-O transparent conducting oxide thin films

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Cited by 127 publications
(88 citation statements)
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“…[18] These semiconductors are characterized by their unique electron transport properties, i.e., the absence of the Hall voltage sign double anomaly, which is commonly observed for existing amorphous semiconductors, [19] and large mobilities (e.g., Hall electron mobility >10 cm 2 V ±1 s ±1 ) comparable to those of the corresponding crystalline materials. [20] These features distinguish amorphous oxide semiconductors from conventional covalent amorphous semiconductors.…”
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confidence: 98%
“…[18] These semiconductors are characterized by their unique electron transport properties, i.e., the absence of the Hall voltage sign double anomaly, which is commonly observed for existing amorphous semiconductors, [19] and large mobilities (e.g., Hall electron mobility >10 cm 2 V ±1 s ±1 ) comparable to those of the corresponding crystalline materials. [20] These features distinguish amorphous oxide semiconductors from conventional covalent amorphous semiconductors.…”
mentioning
confidence: 98%
“…53. This measurement system was then applied 208 to investigate the properties of ZnO alloyed with SnO 2 , in compositions along the ZnO-SnO 2 tie line. Two local maxima in conductivity were reported, for Zn/Sn ratios of 2:1 and 1:1, corresponding to the formation of the amorphous compositions Zn 2 SnO 4 and ZnSnO 3 ; both phases showed good transmission ($80%).…”
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confidence: 99%
“…Such effect can be attributed to the Burstein-Moss shift brought about by increasing carrier concentrations. 43,44 The Burstein-Moss shift due to metal cation doping has been widely reported on many TCOs such as ZTO, 8,9 aluminiumdoped ZTO, 45 and aluminium-doped ZnO. 46 Moreover, a large band gap increase (up to $1 eV) has also been reported in MOCVD ZnO, when the growth temperature is reduced from 500 to 200 C; this was attributed to the increase in extended localization in the conduction band and valence band as the films become amorphous.…”
Section: -mentioning
confidence: 99%
“…22 Various deposition techniques, such as sol-gel, 23,24 atomic layer deposition (ALD), 25,26 metal organic chemical vapour deposition (MOCVD), 27 and pulsed laser deposition (PLD), 21,28 have been reported for ZTO, however, rf or dc magnetron sputtering is most commonly used. [6][7][8][9][10]20,[29][30][31][32] Ceramic ZTO targets with at. % of Zn: Sn of either 1:1 or ).…”
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confidence: 99%