Combined application of ion beam slope cutting and SEM/EDX for investigation of the surface layer system on tungsten microwires after tribological treatment

Abstract

The surface layer system on tungsten wires developed after different technological processing steps and depending on the tribological treatment during the production technology has been investigated. The ion beam slope cutting (IBSC) technique in combination with scanning electron microscopy (SEM) and energy-dispersive x-ray (EDX) analysis has been applied for full three-dimensional determination of the phase and grain microstructure of the border zones of tungsten wires. The IBSC technique was changed for wire-shaped samples and modified by additional ion beam processing steps to characterize the near-surface regions of microwires. Transversal and longitudinal cuts through the border zones of the microwires have been performed for SEM observation and EDX microanalysis of the cut areas. The inhomogeneous three-dimensional distribution of tungsten oxide and graphite (as a lubricant) as well as the fine-grained tungsten structure could be determined with SEM resolution.

Nanoscale imaging of pore‐scale fluid‐fluid‐solid contacts in sandstone

“…BIB‐slope cutting in combination with SEM/EDX imaging was first described by Hauffe [] and Hauffe et al []. The technique allows the preparation of large, damage‐free cross sections and also works in sensitive, strongly heterogeneous, or porous materials [e.g., Grünewald , ; Desbois et al , ; Houben et al , ].…”

“…BIB-slope cutting in combination with SEM/EDX imaging was first described by Hauffe [1977] and Hauffe et al [2002]. The technique allows the preparation of large, damage-free cross sections and also works in sensitive, strongly heterogeneous, or porous materials [e.g., Grünewald, 1999 The combination of the three, cryo-BIB, cryo-SEM, and EDX analysis, enables the determination of phase distribution and phase contacts.…”

Specimen preparation by ion beam slope cutting for characterization of ductile damage by scanning electron microscopy

“…To define the position of the slope section, a tungsten screen was placed on the surface of the sample as shown in Figure (left). A detailed description of characteristic parameters and the resulting surface topography is given in (Hauffe et al, ). The resulting surface topography is shown in Figure (right) in an overview image of the specimen surface after the IBSC treatment.…”