2005
DOI: 10.1016/j.jelechem.2005.07.004
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Combined scanning electrochemical-atomic force microscopy (SECM-AFM): Simulation and experiment for flux-generation at un-insulated metal-coated probes

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Cited by 31 publications
(9 citation statements)
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“…They can be used to probe chemistry in small volumes, to examine chemistry that occurs on a submicrosecond time scale, and to examine electrochemical reactions in solutions of very high resistance . These properties have made microelectrodes particularly useful for applications in biological systems, but also in other applications such as chromatography scanning-probe microscopy , and photoelectrochemical processes . The most common substrates for voltammetric ultramicroelectrodes are platinum, gold, and carbon.…”
Section: Introductionmentioning
confidence: 99%
“…They can be used to probe chemistry in small volumes, to examine chemistry that occurs on a submicrosecond time scale, and to examine electrochemical reactions in solutions of very high resistance . These properties have made microelectrodes particularly useful for applications in biological systems, but also in other applications such as chromatography scanning-probe microscopy , and photoelectrochemical processes . The most common substrates for voltammetric ultramicroelectrodes are platinum, gold, and carbon.…”
Section: Introductionmentioning
confidence: 99%
“…This current underestimation was also seen by Mazurenka et al in cavity ring-down response for cyclic voltammetry and potential-step chronoamperometry (using 2D models in FEMLAB) [26], and Schnippering et al in a thin layer arrangement [27]. Holder et al probed the potential step response of scanning electrochemical-atomic force microscopy via 3D FEM simulation -results show that the response follows Cottrelian behaviour within acceptable limits [28]. Basha et al utilised 2D FEMLAB simulations to model various electrode situations, such as moving electrodes, parallel plate electrodes, hull cells, curvilinear hull cells, thin layer galvanic cells, through hold plating, and recessed disk electrodes, to find good agreement with previously published experiments [29].…”
Section: Previous Literaturementioning
confidence: 63%
“…In order to achieve nanometer resolution in SECM analyses, the AFM technique was recently combined with SECM. Thus, the combined AFM-SECM technique using an AFM cantilever with a conductive coating as the tip electrode for SECM has led to recent progress [55][56][57][58][59][60][61][62][63]. A number of approaches have been attempted in order to use the conductive cantilever as the tip electrode, with the objective to confine the active tip area of the AFM cantilever.…”
Section: Secm With Nanometer Resolution and Afm-secmmentioning
confidence: 99%