2015 IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits &Amp; Systems 2015
DOI: 10.1109/ddecs.2015.23
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Combining Correction of Delay Faults and Transient Faults

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“…Fine-grained transistor level strategies have matured in production yield enhancement but further opportunities exist to extend this to throughlife operation. An alternative yield method relates to direct mitigation against signal delays caused variability in sequential logic components such as flip flops [110]. nMR methods have seem most use within masking strategies, including quadredundancy, but are generally limited to TMR within FPGAs.…”
Section: A Design Perspectivesmentioning
confidence: 99%
“…Fine-grained transistor level strategies have matured in production yield enhancement but further opportunities exist to extend this to throughlife operation. An alternative yield method relates to direct mitigation against signal delays caused variability in sequential logic components such as flip flops [110]. nMR methods have seem most use within masking strategies, including quadredundancy, but are generally limited to TMR within FPGAs.…”
Section: A Design Perspectivesmentioning
confidence: 99%