Comment on ‘‘Infrared divergence of the resonant Raman-Compton scattering’’

Marchetti, Vincent; Franck, Carl

doi:10.1103/physrevlett.65.268

Cited by 8 publications

(1 citation statement)

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“…Finally, in the region E s → 0, Gavrila and Tugulea [24] have predicted a rise of this plateau, a low-frequency 'infrared' divergence (ID). This effect has been interpreted in the base of a simple classical model [9,25] as the radiation emitted from the photoelectrons during their acceleration process inside the atomic field, and so is an intra-atomic bremsstrahlung emission. Bannet et al [9] proved that a simple expression for the KL-RRS at the lower energies is valid, namely:…”

Section: Basic Theorymentioning

confidence: 99%

Measurement of KL and LM resonant Raman scattering cross sections with a proton-induced x-ray beam

Karydas¹,

Paradellis²

1997

J. Phys. B: At. Mol. Opt. Phys.

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The resonant Raman effect has been described as an inelastic scattering process occurring when the energy of the exciting x-ray beam approaches from below the energy of an absorption edge of a target element. It produces a scattered photon with a characteristic maximum energy and the emission of an inner-shell electron. A high monochromatic CrK α x-ray beam produced by protons was utilized for the measurement of the KL type of resonant Raman scattering (RRS) cross sections in V and Cr and of the LM ones in La and Ce. In the case of V and Cr targets, the fluorescence yields of the KL-RRS process were also extracted, while the fine-structure splitting in a LM-RRS spectrum was observed for the first time. The influence of RRS into different topics of x-ray spectrometry, like the quantitative x-ray flourescence analysis, the theoretical calculations of the mass attenuation coefficients or the shape of characteristic xrays emitted from low Z thick targets, is also discussed.

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Section: Basic Theorymentioning

confidence: 99%