1983
DOI: 10.1016/0040-6090(83)90242-0
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Comparative methods for the determination of the gap state density in magnetron-sputtered hydrogenated amorphous silicon

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Cited by 3 publications
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“…Once again, at P H = 8 x 10 " 4 mbar the variation in the deposition temperature of samples shows slightly change in E 0pt . as T s increases from 360 to 523 K. Since previous studies on the material have shown that the photoconductivity and aSi:H devices such as solar cells [14], Schottky diode [15], field effect transistor [16] can be degraded by hydrogen bonded configuration at 2100 cm "' (SiH 2 and/or SiH 3 ), it is of interest to analyze the infrared spectrum results depending on the density of localized states near Fermi -level, N(E F ). We have studied the influence of variation in P H and T s at an argon pressure of 1.1 xlO" 2 mbar on the density of states near Fermi-level.…”
Section: Resultsmentioning
confidence: 98%
“…Once again, at P H = 8 x 10 " 4 mbar the variation in the deposition temperature of samples shows slightly change in E 0pt . as T s increases from 360 to 523 K. Since previous studies on the material have shown that the photoconductivity and aSi:H devices such as solar cells [14], Schottky diode [15], field effect transistor [16] can be degraded by hydrogen bonded configuration at 2100 cm "' (SiH 2 and/or SiH 3 ), it is of interest to analyze the infrared spectrum results depending on the density of localized states near Fermi -level, N(E F ). We have studied the influence of variation in P H and T s at an argon pressure of 1.1 xlO" 2 mbar on the density of states near Fermi-level.…”
Section: Resultsmentioning
confidence: 98%