Comparing functional and structural tests

Maxwell, Peter; Hartanto, I.; Bentz, L.

doi:10.1109/test.2000.894231

Cited by 94 publications

(35 citation statements)

References 15 publications

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“…The complexity of modern electronic systems might make structural test/diagnosis approaches not suitable, therefore functional ones have been designed to overcome such limitation [1]. Functional diagnosis aims at identifying the cause of a failure of an electronic system, i.e., a mismatch between the expected behaviour and the actual one, by applying a set of input stimuli and by observing the system responses, without knowing the internal structure of the system under analysis.…”

Section: Introduction and Related Workmentioning

confidence: 99%

A configurable board-level adaptive incremental diagnosis technique based on decision trees

Bolchini

Cassano

2015

2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS)

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Abstract-Functional diagnosis for complex electronic boards is a time-consuming task that requires big expertise to the diagnosis engineers. In this paper we propose a new engine for board-level adaptive incremental functional diagnosis based on decision trees. The engine incrementally selects the tests that have to be executed and based on the test outcomes it automatically stops the diagnosis as soon as one or more faulty candidates can be identified, thus allowing to reduce the number of executed tests. Moreover, we propose a configurable early stop condition for the engine that allows to further reduce the number of executed tests leveraging the diagnosis accuracy. The effectiveness of the proposed approach has been assessed using a set of synthetic but realistic boards and three industrial boards.

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Section: Introduction and Related Workmentioning

confidence: 99%

A configurable board-level adaptive incremental diagnosis technique based on decision trees

Bolchini

Cassano

2015

2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS)

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“…As it is impossible to test the functionality completely, e.g. all possible arguments of an operation, or all possible instruction orders, it is hard to estimate the final quality of such a functional test and the structural fault coverage is rather limited [4].…”

Section: Introductionmentioning

confidence: 99%

Structural Software-Based Self-Test of Network-on-Chip

Dalirsani

Imhof

Wunderlich

2014

2014 IEEE 32nd VLSI Test Symposium (VTS)

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Software-Based Self-Test (SBST) is extended to the switches of complex Network-on-Chips (NoC). Test patterns for structural faults are turned into valid packets by using satisfiability (SAT) solvers. The test technique provides a high fault coverage for both manufacturing test and online test. Preprint General Copyright NoticeThis article may be used for research, teaching and private study purposes. Any substantial or systematic reproduction, re-distribution, re-selling, loan or sub-licensing, systematic supply or distribution in any form to anyone is expressly forbidden. This is the author's "personal copy" of the final, accepted version of the paper published by IEEE. Abstract-Software-Based Self-Test (SBST) is extended to the switches of complex Network-on-Chips (NoC). Test patterns for structural faults are turned into valid packets by using satisfiability (SAT) solvers. The test technique provides a high fault coverage for both manufacturing test and online test.

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“…However, recent design evaluations have revealed that the delay caused by at-speed scan patterns can be up to 20% longer than any functional patterns [11], due to the discrepancy between functional mode and test mode in scan-based testing. Consequently, some good ICs that would work in application might fail at-speed delay tests, leading to undesired test yield loss [8]. Therefore, to resolve the above over-testing problem, on the other hand, various low-power testing techniques were presented to reduce the PSN effects in at-speed testing [9,14,15,17].…”

Section: Introductionmentioning

confidence: 99%