2013
DOI: 10.1002/xrs.2465
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Comparison between XRF, TXRF, and PXRF analyses for provenance classification of archaeological bricks

Abstract: Ceramics provenance studies based on minor and trace elements are widely used to help in gathering knowledge of local furnace presence and commercial trades. Most of the times, destructive analyses are allowed because of the high amount of material, but sometimes (integer vessels, architectural decorations, etc.), a nondestructive examination is required. In both cases, X-ray fluorescence (XRF) analysis can be a useful tool.In this work, we compare the classification results obtained on a set of bricks from th… Show more

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Cited by 53 publications
(31 citation statements)
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“…Data were collected at 25‐kV high voltage and 0.3‐mA tube current, with 500‐s analysis time. Quantitative analyses are performed using a computational method (Lithos 3000 software) based on the fundamental parameters and already tested in previous works . This method considers, in addition to the characteristic X‐ray lines of the elements, also the intensity ratio of the scattered peaks to get information on effective Z of low elements' matrix or at least on its behavior regarding X‐ray absorption .…”
Section: Methodsmentioning
confidence: 99%
See 1 more Smart Citation
“…Data were collected at 25‐kV high voltage and 0.3‐mA tube current, with 500‐s analysis time. Quantitative analyses are performed using a computational method (Lithos 3000 software) based on the fundamental parameters and already tested in previous works . This method considers, in addition to the characteristic X‐ray lines of the elements, also the intensity ratio of the scattered peaks to get information on effective Z of low elements' matrix or at least on its behavior regarding X‐ray absorption .…”
Section: Methodsmentioning
confidence: 99%
“…Several techniques can be exploited for this aim, such as atomic emission spectroscopy, proton‐induced X‐ray emission, inductively coupled plasma, neutron activation analysis, and Raman and infrared spectroscopy . Also X‐ray fluorescence (XRF) has been used, mostly on ground ceramics, representative of the whole object . Thanks to the development of portable XRF, this technique is particularly suitable to detect the chemical elements of archaeological unmovable objects.…”
Section: Introductionmentioning
confidence: 99%
“…The present work contributes to this debate regarding pXRF through the study of Caltagirone pottery raw materials. Recently, similar studies undertaking chemical analysis of pottery have been performed using samples derived from Italian archaeological sites (Barone, et al, 2011;Donais, Wojtas, Desmond, Duncan & George, 2012;Bonizzoni, Galli, Gondola & Martini, 2013;Ceccarelli, Rossetti, Primavesi & Stoddart, 2016).…”
Section: Introductionmentioning
confidence: 99%
“…Concerning the effect of pottery firing conditions on bulk elemental compositions, there are many examples of studies that have used XRF, as well as other techniques (Cogswell, Neff & Glascock, 1996;Perlman & Asaro, 1969;Poole & Finch, 1972;Attas, Yaffe & Fossey, 1977;Kilikoglou, Maniatis & Grimanis, 1988;Storey, 1988;Maritan, et al, 2006;Bonizzoni, et al, 2013). In some studies considering the effect of changes in firing temperature on microstructure and physical properties of clay, XRF has been used for bulk chemical analyses (Cultrone, Rodriguez-Navarro, Sebastian, Cazalla, & De La Torre, 2001;Eramo, Laviano, Muntoni, & Volpe, 2004;Kurama, Kara, & Kurama, 2006;Johari, Said, Hisham, Bakar & Ahmad, 2010).…”
Section: Introductionmentioning
confidence: 99%
“…Different approaches have been proposed and applied in the last decades [4][5][6][7][8] ; at the same time, attempts to classify light matrix samples avoiding a precise quantitative determination have been made. [9][10][11] Going on in the same direction and starting from a case study of light matrix materials (enamels from a Limoges altar cross datable to the end of the 12th century, held in the Poldi Pezzoli Museum in Milan, Italy), this work combines different techniques, all based on the detection of secondary X-rays produced by the interaction of a primary beam with the sample material. EDXRF, portable Xray fluorescence (PXRF) and electron probe micro-analysis (EPMA) are exploited, each one for its own peculiar trait, to give a complete characterization in terms of composition of low-Z matrix samples.…”
mentioning
confidence: 99%