2014 IEEE 57th International Midwest Symposium on Circuits and Systems (MWSCAS) 2014
DOI: 10.1109/mwscas.2014.6908567
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Comparison of 130 nm technology 6T and 8T SRAM cell designs for Near-Threshold operation

Abstract: Power consumption is an important aspect of almost any electrical device design. Near-Threshold Computing (NTC) is a voltage scaling technique that makes it possible to reduce the power consumption of CMOS devices with the cost of speed and reliability. We are using NTC to design low-power cache memory circuit for a low-performance sensor-based system. Caches consume noteworthy portions of power and area of this kind of systems, and therefore reducing their power consumption has a meaningful impact on the over… Show more

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Cited by 18 publications
(6 citation statements)
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“…The proposed novel FinFET and CNFET SRAMs are compared with the conventional FinFET 8T SRAM [21,22]. All FinFETs and CNFETs used in the experiment were simulated at room temperature (27 • C) and VDD = 0.9 v in 32-nm technology.…”
Section: Sram Operationmentioning
confidence: 99%
“…The proposed novel FinFET and CNFET SRAMs are compared with the conventional FinFET 8T SRAM [21,22]. All FinFETs and CNFETs used in the experiment were simulated at room temperature (27 • C) and VDD = 0.9 v in 32-nm technology.…”
Section: Sram Operationmentioning
confidence: 99%
“…Although 6T SRAM cell is indeed more vulnerable due to mismatches between the transistors in the cross-coupled inverters [20], it can be designed to overcome its vulnerability and work reliably in NTC with voltage boosting topology. 6T SRAM cell also leaks at least 4.5% less, and a single cell is over 30% smaller in area than 8T SRAM cell, which indicates that 6T SRAM cell remains an appealing choice for a NTC with voltage boosting SoC [21].…”
Section: Memory Reliability In Ntcmentioning
confidence: 99%
“…Although 6T SRAM cell is indeed more vulnerable due to mismatches between the transistors in the cross-coupled inverters [19], it can be designed to overcome its vulnerability and work reliably in NTC with voltage boosting topology. 6T SRAM cell also leaks at least 4.5% less, and a single cell is over 30% smaller in area than 8T SRAM cell, which indicates that 6T SRAM cell remains an appealing choice for a NTC with voltage boosting SoC [20].…”
Section: Memory Reliability In Ntcmentioning
confidence: 99%