2016
DOI: 10.1364/oe.24.029060
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Comparison of attosecond streaking and RABBITT

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Cited by 60 publications
(63 citation statements)
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“…In the process of RABBITT, the IR photon couples electrons ionized from two neighboring harmonics to interfere into the sideband signal of the RABBITT trace [27]. Provided that the target photoemission phase varies slowly with energy, RABBITT is very accurate in measuring the energy-dependent photoemission delays.…”
Section: B Resultsmentioning
confidence: 99%
“…In the process of RABBITT, the IR photon couples electrons ionized from two neighboring harmonics to interfere into the sideband signal of the RABBITT trace [27]. Provided that the target photoemission phase varies slowly with energy, RABBITT is very accurate in measuring the energy-dependent photoemission delays.…”
Section: B Resultsmentioning
confidence: 99%
“…We compared and verified the accuracy of single-photon photoemission delay measurements using both, the RABBITT and the streaking technique 26 . For this, we measured the relative photoemission delay between electrons originating from the Ne 2p and the Ar 3p ground states.…”
Section: Ionization Dynamics In Atomsmentioning
confidence: 96%
“…These two main contributions can in general not be separated from each other in a single measurement. Thus, a simultaneous reference measurement from a different state of the same atom 22 or a different species has to be performed 26,28 . Subtraction of the phases from the two different states or species yields the difference of the respective atomic phases, while the identical APT-specific phase cancels out.…”
Section: Ionization Dynamics In Atomsmentioning
confidence: 99%
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“…Despite the large variety of the developed methods, lots of work still needs to be done mainly in the comparative studies between different approaches [97,168] and the extension of these methods to higher XUV photon energies and shorter asec pulse durations (see Section 5). The appropriateness of these methods to the characterization of asec pulses generated by solid-surfaces is quite limited.…”
Section: Characterization Of Xuv Sourcesmentioning
confidence: 99%