2010
DOI: 10.1016/j.diamond.2009.09.015
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Comparison of high voltage and high temperature performances of wide bandgap semiconductors for vertical power devices

Abstract: Temperature dependant properties of wide band gap semiconductors have been used to calculate theoretical specific on-resistance, breakdown voltage, and thermal run away temperature in SiC, GaN and diamond, and Si vertical power devices for comparison. It appears mainly that diamond is interesting for high power devices for high temperature applications. At room temperature, diamond power devices should be superior to SiC only for voltage higher than 30-40 kV, due to the high energy activation of the dopants.

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Cited by 90 publications
(46 citation statements)
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“…Operation at high temperature (> 200°C ambient) and high voltage (540 V in the case of a "HVDC"aeronautic network) exceeds the capability of silicon power devices [4]. In such conditions, power devices based on wide-bandgap materials are required.…”
Section: Power Devicesmentioning
confidence: 99%
“…Operation at high temperature (> 200°C ambient) and high voltage (540 V in the case of a "HVDC"aeronautic network) exceeds the capability of silicon power devices [4]. In such conditions, power devices based on wide-bandgap materials are required.…”
Section: Power Devicesmentioning
confidence: 99%
“…The aims are mass, volume, and cost savings and higher T j devices are required. The recent silicon carbide components emergence (Cooper Jr. & Agarwal, 2002), with promising operating temperatures well above 200 °C (Raynaud, 2010) in the future, represents a perspective of offer which will even encourage new demands. As a consequence, the research for high temperature operating dielectrics suitable for the semiconductor die assembly has become essential for the development of the full systems, as insulating materials are among the key points for its performance and reliability.…”
Section: Needs For High Temperature Semiconductor Devicesmentioning
confidence: 99%
“…These offer wider bandwidth operation and lower system size compared to Si-and GaAs-based technologies [3][4].…”
Section: Introductionmentioning
confidence: 99%