Comparison of SEM and optical analysis of DT neutron tracks in CR-39 detectors

Abstract

CR-39 detectors were exposed to DT neutrons generated by a Thermo Fisher model A290 neutron generator. Afterwards, the etched tracks were examined both optically and by scanning electron microscopy (SEM). The purpose of the analysis was to compare the two techniques and to determine whether additional information on track geometry could be obtained by SEM analysis. The use of these techniques to examine triple tracks, diagnostic of ≥9.6 MeV neutrons, observed in CR-39 used in Pd/D co-deposition experiments will also be discussed.

Digital holographic microscopy for recording and analysis of 3D images of etched tracks in LR-115 SSNTD

“…The most common method employed to analyze etched tracks is optical microscopy [4][5][6]. Atomic force microscopy (AFM) [7,8] and scanning electron microscopy (SEM) [9,10] have been used to analyze tracks in CR-39 detectors. 3D nuclear track morphology in CR-39 detectors has been also studied by confocal microscopy [11] and digital holographic microscopy (DHM) [12].…”