“…Our measurements indicate a 4-10% of 90°domain switch, somewhat less than usually reported ͑Jona and Shirane 16 cite this percentage as 10-12% from different studies͒. Because our measurements are for the bulk only, they probably confirm that poling effects are more pronounced at the surface, 10 where the 90°d omain switching would be less inhibited because the stress must relax.…”
Section: A 90°domain Switchingcontrasting
confidence: 50%
“…The observation that poling broadens diffraction lines disagrees with results of Seth, Gatins, and Schulze. 10 They observed the sharpening of diffraction lines upon poling, which was explained by the growth of ferroelectric domains. However, such sharpening is not likely to occur, even if the broadening on a scale of the ferroelectric domain is considered because the size of 90°domains will decrease, which will augment the diffraction-line broadening.…”
We report evidence for a significant increase of bulk dislocation density upon poling of polycrystalline BaTiO 3. The synchrotron high-resolution x-ray-diffraction measurements yield a dislocation density on the order of 10 9 /cm 2 and an associated strain-energy increase of about 20 kJ/m 3. This implies that the application of an external poling field generates defects in the structure and increases the internal stress. Possible consequences in both bulk and thin-film applications include accelerated aging and microcracking. ͓S0163-1829͑99͒06005-1͔
“…Our measurements indicate a 4-10% of 90°domain switch, somewhat less than usually reported ͑Jona and Shirane 16 cite this percentage as 10-12% from different studies͒. Because our measurements are for the bulk only, they probably confirm that poling effects are more pronounced at the surface, 10 where the 90°d omain switching would be less inhibited because the stress must relax.…”
Section: A 90°domain Switchingcontrasting
confidence: 50%
“…The observation that poling broadens diffraction lines disagrees with results of Seth, Gatins, and Schulze. 10 They observed the sharpening of diffraction lines upon poling, which was explained by the growth of ferroelectric domains. However, such sharpening is not likely to occur, even if the broadening on a scale of the ferroelectric domain is considered because the size of 90°domains will decrease, which will augment the diffraction-line broadening.…”
We report evidence for a significant increase of bulk dislocation density upon poling of polycrystalline BaTiO 3. The synchrotron high-resolution x-ray-diffraction measurements yield a dislocation density on the order of 10 9 /cm 2 and an associated strain-energy increase of about 20 kJ/m 3. This implies that the application of an external poling field generates defects in the structure and increases the internal stress. Possible consequences in both bulk and thin-film applications include accelerated aging and microcracking. ͓S0163-1829͑99͒06005-1͔
“…This was undertaken on crushed and annealed powders in order to alleviate the influence of surface effects such as texture and stress. 28 Quantitative analysis of diffraction patterns was completed using PANalytical X'Pert HighScore Plus software.…”
Article:Bennett, J, Bell, AJ, Stevenson, TJ et al.(1 more author) (2013) Tailoring the structure and piezoelectric properties of BiFeO3-(K0.5Bi0.5)TiO3-PbTiO3 ceramics for high temperature applications. Applied Physics Letters, 103 (15). 152901.
“…Please note that the c-axis of the tetragonal BaTiO 3 is expected to align along the surface normal. 15) Hereafter we call this sample the Fe/BaTiO 3 thin film. The Fe layer was deposited by electron-bombardment heating of an Fe rod, and the growth rate was controlled by a quartzmembrane thickness monitor.…”
We develop a bond-length mapping technique without two-dimensional scanning by combining photoelectron emission microscopy with extended X-ray absorption fine structure (EXAFS) analysis. Several tens of thousands of EXAFS data are simultaneously acquired, which corresponds to a data acquisition time less than 1 second per spectrum. We apply this technique to an Fe/BaTiO3 thin film, and two-dimensional distribution of the Fe–Fe bond length at the Fe surface is observed. From the Fe K-edge EXAFS analysis, we find that the Fe–Fe bond length is ∼2.52 Å over the whole area with a Gaussian distribution of ∼0.01 Å, which implies that this technique realizes a bond-length mapping with precise bond-length determination.
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