“…The surfaces of III-V compound semiconductors have been studied by various experimental methods such as x-ray diffraction (XRD), 5 scanning tunneling microscopy (STM), 6,7 photoemission spectroscopy (PES), [8][9][10] transmission electron diffraction (TED), 11 and low-energy electron diffraction (LEED). The majority of these efforts focused on the analysis of surface structures on (001) substrates, [12][13][14][15][16][17] the reconstruction phase diagrams, 18,19 and the understanding of their growth kinetics.…”