Comparison of the Susceptibility to Soft Errors of SRAM-Based FPGA Error Correction Codes Implementations

Liu, Shih‐Fu; Sorrenti, G; Reviriego, Pedro; Casini, F.; Maestro, Juan Antonio; Alderighi, M.; Mecha, Hortensia

doi:10.1109/tns.2012.2193417

Cited by 13 publications

(2 citation statements)

References 17 publications

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“…Under space radiation environments, soft-errors occur frequently on the configuration memory of FPGAs [6], [7], [8], as do dynamic random access memories (DRAMs) and static random access memories (SRAMs) [4], [5]. To decrease the frequency of soft-errors of the configuration memory, various scrubbing methods have been proposed that can refresh the configuration memory on an FPGA with a single configuration context [9], [10], [11], [12], [13].…”

Section: Introductionmentioning

confidence: 99%

Sequential Circuit Implementation Method for Multi-Context Scrubbing Operations on FPGAs

Murakami

Watanabe

2021

2021 IEEE International Symposium on Circuits and Systems (ISCAS)

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This paper presents a proposal for a sequential circuit implementation method for multi-context scrubbing operations that can treat soft-error and permanent failure issues simultaneously. Although multi-context scrubbing operations can treat permanent failure issues on field programmable gate arrays (FPGAs), implementing sequential circuits is difficult because the flip-flop location must be changed while maintaining sequential operations. Therefore, no multi-context scrubbing operation including a sequential circuit has been demonstrated to date. As described herein, a multi-context scrubbing operation using a simple 8-bit counter circuit has been demonstrated perfectly on an Artix-7 FPGA (XC7A35TICSG324-1L). This paper presents experimentally obtained results of that demonstration.

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Section: Introductionmentioning

confidence: 99%

Sequential Circuit Implementation Method for Multi-Context Scrubbing Operations on FPGAs

Murakami

Watanabe

2021

2021 IEEE International Symposium on Circuits and Systems (ISCAS)

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“…Error correcting codes (ECCs), as a mitigation technique, have been frequently adopted in memory design to improve reliability and tolerate faults [10][11][12]. In this paper, the following codes will be studied: the Hamming codes and the Bose, Chaudhuri, and Hocquenghem (BCH) codes.…”

Section: Introductionmentioning

confidence: 99%

Implementation and verification of different ECC mitigation designs for BRAMs in flash-based FPGAs

Yang¹,

Wang²,

Zhang³

et al. 2016

Chinese Phys. C

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Abstact: Embedded RAM blocks (BRAMs) in field programmable gate arrays (FPGAs) are susceptible to single event effects (SEEs) induced by environmental factors such as cosmic rays, heavy ions, alpha particles and so on. As technology scales, the issue will be more serious. In order to tackle this issue, two different error correcting codes (ECCs), the shortened Hamming codes and shortened BCH codes, are investigated in this paper. The concrete design methods of the codes are presented. Also, the codes are both implemented in flash-based FPGAs. Finally, the synthesis report and simulation results are presented in the paper. Moreover, the heavy-ion experiments are performed, the experimental results indicate that the error cross-section using the shortened Hamming codes can be reduced by two orders of magnitude compared with the device without mitigation, and no errors are discovered in the experiments for the device using the shortened BCH codes.

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Reliability Model for Multiple-Error Protected Static Memories

Jahanirad

2017

J Electron Test

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Comparison of the Susceptibility to Soft Errors of SRAM-Based FPGA Error Correction Codes Implementations

Cited by 13 publications

References 17 publications

Sequential Circuit Implementation Method for Multi-Context Scrubbing Operations on FPGAs

Sequential Circuit Implementation Method for Multi-Context Scrubbing Operations on FPGAs

Implementation and verification of different ECC mitigation designs for BRAMs in flash-based FPGAs

Reliability Model for Multiple-Error Protected Static Memories

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