1977
DOI: 10.1063/1.89773
|View full text |Cite
|
Sign up to set email alerts
|

Composition-tuned PbSxSe1−x Schottky-barrier infrared detectors

Abstract: Schottky-barrier photodiodes were prepared by depositing either lead or indium onto p-type PbSxSe1−x epitaxial films. These photodiodes had 77 °K zero-bias resistance-area products of 26–21 000 Ω cm2 as x varied from 0 to 1, respectively. The peak detectivities were close to the background limit and could be composition tuned between 3.7 and 6.9 μm at 77 °K. Narrowband detectors were prepared by using one film as a short-wavelength cutoff filter and a second film, of slightly different composition, as the dete… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1

Citation Types

0
4
0

Year Published

1980
1980
2012
2012

Publication Types

Select...
5
3

Relationship

0
8

Authors

Journals

citations
Cited by 41 publications
(4 citation statements)
references
References 5 publications
0
4
0
Order By: Relevance
“…However, changing the contact metal from gold to calcium (|Δϕ m | = 2.3 eV) results in only a 0.15 V increase in V OC , which suggests that the surface Fermi level is pinned and the barrier height is relatively independent of the metal. Schottky barrier formation is often due to defects formed at an interface by deposition of a metal . Direct evidence for the Schottky junction was obtained by capacitance−voltage ( C − V ) measurements on complete cells …”
Section: Applications: Quantum Dot Solar Cellsmentioning
confidence: 99%
See 1 more Smart Citation
“…However, changing the contact metal from gold to calcium (|Δϕ m | = 2.3 eV) results in only a 0.15 V increase in V OC , which suggests that the surface Fermi level is pinned and the barrier height is relatively independent of the metal. Schottky barrier formation is often due to defects formed at an interface by deposition of a metal . Direct evidence for the Schottky junction was obtained by capacitance−voltage ( C − V ) measurements on complete cells …”
Section: Applications: Quantum Dot Solar Cellsmentioning
confidence: 99%
“…Schottky barrier formation is often due to defects formed at an interface by deposition of a metal. 221 Direct evidence for the Schottky junction was obtained by capacitance-voltage (C-V) measurements on complete cells. 219 The location of the Schottky junction was determined by comparing the EQE spectra from cells of different thickness.…”
Section: Schottky Junction and P-n Junction Solar Cells Based On Film...mentioning
confidence: 99%
“…However, changing the contact metal from gold to calcium (|Δϕ m | = 2.3 eV) results in only a 0.15 V increase in V OC , which suggests that the surface Fermi level is pinned and the barrier height is relatively independent of the metal. Schottky barrier formation is often caused by defects formed at an interface by deposition of a metal, and this could easily be the case here. We note also that devices with gold top contacts do not switch polarity (that is, gold does not become the positive electrode) despite the fact that the work function of gold is substantially larger than that of ITO.…”
mentioning
confidence: 99%
“…Thin films of Pb 0.8 Sn 0.2 Te have high prospects for applications in many fields such as infrared (IR) detectors, optoelectronics [1][2][3][4] and as a thermoelectric material [5]. The number of investigations carried out to understand the electrical conduction mechanism in thin films of this material are few [6][7][8][9][10][11][12].…”
Section: Introductionmentioning
confidence: 99%