Comprehensive Simulation of Vertical Cavity Surface Emitting Lasers: Inclusion of a Many-Body Gain Model

Witzigmann, Bernd; Aschwanden, Manuel; Laino, V.; Luisier, Mathieu; Odermatt, Stefan; Streiff, Matthias; Witzig, Andreas; Royo, P.; Vez, Dominique

doi:10.1007/s10825-005-7097-6

Cited by 10 publications

(4 citation statements)

References 6 publications

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“…The device consists of a multiple QW active region made of GaAs. Devices comparable to the one used here are discussed in [3,4,8]. For the simulations in this work, a 2-D setup has been used exploiting the rotational symmetry of the device and the basic material parameters have been taken from [7].…”

Section: Resultsmentioning

confidence: 99%

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Single-mode performance analysis for vertical-cavity surface-emitting lasers

Odermatt

Witzigmann

Eitel³

2007

J Comput Electron

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In this work, the simulation of the single-mode stability in vertical-cavity surface-emitting lasers (VCSELs) is presented using a microscopic electro-opto-thermal model. Experimental data for oxide-confined VCSELs emitting at 850 nm with different contact metal designs are also available. It is shown that detailed models for the optical losses in the cavity consisting of outcoupling and absorption are required in order to explain the experiments. The role of cavity losses and spatial hole burning in the nonlinear electro-optothermal simulation framework is discussed in a quantitative manner.

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Section: Resultsmentioning

confidence: 99%

“…Thermal effects are modeled by a continuity equation for the heat flux. The interaction between carriers and the optical field is governed by the microscopic polarization based on Heisenberg's equation of motion in the second Born approximation [4]. The quantum well (QW) bandstructure is calculated by an 8-band k·p method [5].…”

Section: Simulation Modelsmentioning

confidence: 99%

Single-mode performance analysis for vertical-cavity surface-emitting lasers

Odermatt

Witzigmann

Eitel³

2007

J Comput Electron

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“…There is also another comprehensive and partially selfconsistent VCSEL model known from literature [20] with some parts more exact than ours. But also in this case other than ours model simplifications (e.g.…”

Section: The Modelmentioning

confidence: 90%

Comparative analysis of lasing performance of oxide-confined and proton-implanted vertical-cavity surface-emitting diode lasers

Sarzała

Piskorski

2010

Appl. Phys. A

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The comprehensive optical-electrical-thermalrecombination self-consistent VCSEL model is used to compare the performance of oxide-confined (OC) and protonimplanted (PI) VCSELs and to optimise their structures. Generally index-guided (IG) OC VCSELs demonstrate lower lasing thresholds whereas both gain-guided (GG) OC and PI ones manifest much better mode selectivity. Therefore, their either low-threshold IG or mode-selective GG versions may be intentionally used for different VCSEL applications. Lasing thresholds of OC IG VCSELs have been found to be very sensitive to the exact localisation of their thin oxide apertures, which should be shifted as close as possible towards the anti-node position. PI VCSELs, on the other hand, are simpler and cheaper in their manufacturing than OC ones. Although lower threshold currents are manifested by PI VCSELs with very thick implanted regions, lower threshold powers are achieved in these devices with much thicker upper unaffected layer used for the radial current flow from the ring contact towards the laser axis. Paradoxically poor thermal properties of PI VCSELs enable lower lasing thresholds of slightly detuned devices. To conclude, cheaper and mode-selective PI VCSELs may be used instead of OC ones in many of their applications provided ambient temperatures and laser outputs are not too high.

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“…There is also another comprehensive VCSEL model known from literature [10][11][12] without some of the above shortcomings. But also in this case other than ours model simplifications (e.g.…”

Section: The Modelmentioning

confidence: 99%

Sensitivity of a VCSEL threshold performance to inaccuracies in its manufacturing

Zujewski

Nakwaski

2010

Opto-Electronics Review

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The paper describes an impact of various possible inaccuracies in manufacturing of verticalcavity surface-emitting diode lasers (VCSELs), like thicknesses and compositions of their layers different from assumed ones, on VCSEL room-temperature (RT) continuous-wave (CW) threshold performance. To this end, the fully self-consistent comprehensive optical-electrical-thermal-recombination VCSEL model has been applied. While the analysis has been carried out for the 1.3-μm oxide-confined intra-cavity contacted GaInNAs/GaAs VCSEL, its conclusions are believed to be more general and concern most of modern VCSEL designs. As expected, the VCSEL active region has been found to require the most scrupulous care in its fabrication, any uncontrolled variation in compositions and/or thicknesses of its layers is followed by unaccepted RT CW lasing threshold increase. Also spacer thicknesses should be manufactured with care to ensure a proper overlapping of the optical standing wave and both the gain and lossy areas within the cavity. On the contrary, less than 5% thickness changes in distributed-Bragg-reflectors are followed by nearly insignificant changes in VCSEL RT CW threshold. However, exceeding the above limit causes a rapid increase in lasing thresholds. As expected, in all the above cases, VCSELs equipped with larger active regions have been confirmed to require more careful technology. The above results should enable easier organization of VCSEL manufacturing.

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Comprehensive Simulation of Vertical Cavity Surface Emitting Lasers: Inclusion of a Many-Body Gain Model

Cited by 10 publications

References 6 publications

Single-mode performance analysis for vertical-cavity surface-emitting lasers

Single-mode performance analysis for vertical-cavity surface-emitting lasers

Comparative analysis of lasing performance of oxide-confined and proton-implanted vertical-cavity surface-emitting diode lasers

Sensitivity of a VCSEL threshold performance to inaccuracies in its manufacturing

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