2021
DOI: 10.1109/ted.2020.3037277
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Computational Investigation of Negative Capacitance Coaxially Gated Carbon Nanotube Field-Effect Transistors

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Cited by 30 publications
(29 citation statements)
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“…From simulation point of view, the ferroelectric field-effect transistors endowed with a MFMIS system can be treated as a baseline field-effect transistor in series with a ferroelectric capacitor [ 25 , 40 , 41 , 42 , 43 , 44 ]. Therefore, conceptually, the numerical modeling of the negative capacitance (MFMIS) nanodevices is divided into two parts [ 45 ]. The first step of simulation deals with the baseline device as mentioned above in the Section 3 .…”
Section: Resultsmentioning
confidence: 99%
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“…From simulation point of view, the ferroelectric field-effect transistors endowed with a MFMIS system can be treated as a baseline field-effect transistor in series with a ferroelectric capacitor [ 25 , 40 , 41 , 42 , 43 , 44 ]. Therefore, conceptually, the numerical modeling of the negative capacitance (MFMIS) nanodevices is divided into two parts [ 45 ]. The first step of simulation deals with the baseline device as mentioned above in the Section 3 .…”
Section: Resultsmentioning
confidence: 99%
“…After the self-consistency, the gate charge ( Q G ) is numerically extracted and used to compute the voltage across the FE material ( V FE ), using the 1-D steady-state Landau–Khalatnikov equation, which is given as follows [ 34 ]: V FE = 2 αt FE Q G + 4 βt FE Q G 3 + 6 γt FE Q G 5 where t FE is the FE thickness; and (α, β, and γ) are the FE Landau coefficients, which are chosen to be as those of the Al-doped HfO 2 FE parameters [ 25 , 44 , 45 , 46 ]. After computing V FE , the external gate voltage ( V GS ) of the EDJL-CNTTFET is normally computed by using the following equation [ 25 , 39 , 40 , 41 , 42 , 43 , 44 , 45 ]: V GS = V INT + V FE where V INT is the internal metal-gate voltage considered in the baseline self-consistent quantum simulation. For more computational information regarding the quantum simulation of ultrascaled MFMIS FE-FETs, we refer the reader to our previous works [ 19 , 25 , 45 ].…”
Section: Resultsmentioning
confidence: 99%
“…During the last few years, negative capacitance FETs with outstanding electronic properties have gained considerable attention as a potential candidate beyond conventional CMOS technology [12], [13], [27]. A negative capacitance transistor's functionality depends on two fundamental factors: (1) the utilized ferroelectric material, and (2) the baseline transistor.…”
Section: Platform and Basic Theorymentioning
confidence: 99%
“…1. It is worth noting that a metal-ferroelectric-metal-insulator-semiconductor (MFMIS) structure has been considered due to the better I ON /I OFF current ratio for ultra-scaled dimensions [12]. In a NC-CNTFET, parallel semiconducting carbon nanotubes are placed over an insulator such as SiO 2 to establish the channel region.…”
Section: Platform and Basic Theorymentioning
confidence: 99%
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