Area-selective depositions (ASDs)
exploit surface reactivity differences
to deposit a material on a desired growth surface. This chemically
driven process produces a reflection of the prepattern, commonly,
through the use of either atomic layer deposition (ALD) or chemical
vapor deposition (CVD). The ASD of TaN may offer significant benefits
in device fabrication. For instance, in silicon technologies, this
offers the ability to lower the resistivity between metal interconnect
levels and therefore to reduce stage delay (RC delay). However, the
deposition of TaN thin films in an area-selective manner is challenging
due to the temperature requirements for a high-quality ALD film, which
may exceed the thermal stability of typical organic surface modifications.
We report on the synthesis of an organic inhibitor that incorporates
a thermal/photoreactive diyne moiety to enable cross-linking of the
inhibitor film and subsequent use in a selective TaN process, which
was maintained over a large process window, during the 300 °C
TaN ALD process. On patterned substrates, up to 3.8 nm of a TaN film
could be deposited on SiN or mesoporous SiCOH without detectable Ta
amounts on either a Cu or W surface. The same concept of cross-linking
the inhibiting layer was also applied to a reactive vapor-phase inhibitor,
propargylamine, found to inhibit TaN, though with a narrower process
window (on blanket films). On via patterns, this selective TaN process
was achieved but exhibits a distinct tapered profile. The methods
described demonstrate the compatibility of several reactive inhibitors
to enable the selective deposition of TaN at an ALD temperature compatible
with many device fabrication schemes.