Concentration profile determination by pixe analysis utilizing the variation of beam energy

A new method for determining the depth profile of trace elements by PIXE

“…We now briefly discuss three problems relevant to profile analysis by PIXE. First, we show that when direct determination of the profile through solution of equation ( 1) is compared with the 'damped profile' method introduced by Vegh et a1 [6], the former is superior. Figure 3 shows the profile of Zn concentration in silver following a 24-hour anneal using the damping method, while figure 4 shows the Zn concentration profile in Ag for a homogeneous sample also using the damping method.…”

“…PIXE can analyse almost all 2 9 elements, and this can hardly be achieved by nuclear reaction analysis. Thus to perfect the technique of determining the profile of trace elements by PIXE it is undoubtedly of great importance to bring the potential of PIXE analysis into Since Reuter's early work, there have been various studies of the subject [1][2][3][4][5][6]. But because of certain mathematical difficulties involved in the problem, the research has not made substantial progress for a considerable period.…”

“…But because of certain mathematical difficulties involved in the problem, the research has not made substantial progress for a considerable period. A favourable turn of events occurred following the work of Vegh's group [6]. Vegh and others adopted the method of iteration with a smoothing procedure and obtained an acceptable depth profile of trace elements for the first time.…”