2006
DOI: 10.1364/ol.31.001465
|View full text |Cite
|
Sign up to set email alerts
|

Condenser for Koehler-like illumination in transmission x-ray microscopes at undulator sources

Abstract: We report on a novel condenser for full-field transmission x-ray microscopes that use synchrotron radiation from an undulator source. The condenser produces a Koehler-like homogeneous intensity distribution in the sample plane and eliminates object illumination problems connected with the high degree of spatial coherence in an undulator beam. The optic consists of a large number of small linear diffraction gratings and is therefore relatively easy to manufacture. First imaging experiments with a prototype cond… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1

Citation Types

1
16
0

Year Published

2008
2008
2021
2021

Publication Types

Select...
5
3
2

Relationship

1
9

Authors

Journals

citations
Cited by 34 publications
(17 citation statements)
references
References 7 publications
1
16
0
Order By: Relevance
“…The focal length is f c = 34 mm at 852 eV photon energy. The deflected radiation from each grating overlaps in the focal plane to form a homogeneous illumination profile [6] FIGURE 2: Schematic setup of the fast gateable X-ray detector. The microscope image is projected on a P46 phosphor screen and imaged by a relay optic onto an image intensifier.…”
Section: Methodsmentioning
confidence: 99%
“…The focal length is f c = 34 mm at 852 eV photon energy. The deflected radiation from each grating overlaps in the focal plane to form a homogeneous illumination profile [6] FIGURE 2: Schematic setup of the fast gateable X-ray detector. The microscope image is projected on a P46 phosphor screen and imaged by a relay optic onto an image intensifier.…”
Section: Methodsmentioning
confidence: 99%
“…A grating condenser [28] consisting of 940 diffraction gratings of 25 × 25-μm 2 size and an included central stop homogeneously illuminates the sample with a flat-top profile of 20-μm diameter. The sample plane is directly imaged with a magnification of 700 onto a two-dimensional pixel detector by a micro zone plate of 80-μm diameter and an outermost zone width of 50 nm limiting the spatial resolution of the instrument to 65 nm [27] according to the Rayleigh criterion.…”
Section: Methodsmentioning
confidence: 99%
“…The TwinMic condenser is an unconventional beamshaping diffractive optic consisting of a number of concentrically arranged linear gratings with different line widths, producing a Koehler-type, almost homogeneous intensity distribution in the specimen plane (11). This condenser zone plate (CZP) is 1 mm in diameter and consists of 256 grating elements in 5 rings.…”
Section: Full-field Imaging (Txm)mentioning
confidence: 99%