2016
DOI: 10.1109/led.2016.2537051
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Conductance of Threading Dislocations in InGaAs/Si Stacks by Temperature-CAFM Measurements

Abstract: Abstract-The stacks of III-V materials, grown on the Si substrate, that are considered for fabrication of highly scaled devices tend to develop structural defects, in particular Threading Dislocations (TDs), which affect device electrical properties. We demonstrate that the characteristics of TD sites can be analyzed by utilizing the Conductive Atomic Force Microscopy (CAFM) technique with nanoscale spatial resolution within a wide temperature range. In the studied InGaAs/Si stacks, electrical conductance thro… Show more

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Cited by 10 publications
(3 citation statements)
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“…[21] The leakage current is governed by the emission of electrons via trap state into a continuum of states associated with the presence of conductive dislocations. [22] The forward I-V curves have been analyzed in terms of various conduction mechanisms to find that the data can be fitted best to the Frenkel-Poole mechanism. [19] The current density associated with the Frenkel-Poole mechanism is given by [23]…”
Section: Resultsmentioning
confidence: 99%
“…[21] The leakage current is governed by the emission of electrons via trap state into a continuum of states associated with the presence of conductive dislocations. [22] The forward I-V curves have been analyzed in terms of various conduction mechanisms to find that the data can be fitted best to the Frenkel-Poole mechanism. [19] The current density associated with the Frenkel-Poole mechanism is given by [23]…”
Section: Resultsmentioning
confidence: 99%
“…We analyze the forward I-V curves in terms of various conduction mechanisms to find that the data can be fitted best to the Frenkel-Poole (FP) mechanism. [20] The Frenkel-Poole mechanism refers to a conduction mediated by carrier-trap states, which gives the J-E relation as follows: [21]…”
Section: Resultsmentioning
confidence: 99%
“…Electrical conduction along dislocation lines in semiconductors is quite an old subject. Probably its first experimental observation was in 1953 [42] and it is still nowadays the subject of intense research [43]. One possible mechanism for dislocation-conduction is the Poole-Frenkel effect [44], but, whatever the mechanism responsible for the electrical conduction, the spins of the charge carriers will be polarized, as seen above.…”
mentioning
confidence: 99%