Articles you may be interested inMultilevel unipolar resistive switching with negative differential resistance effect in Ag/SiO2/Pt device J. Appl. Phys. 116, 154509 (2014); 10.1063/1.4898807 Intrinsic SiOx-based unipolar resistive switching memory. I. Oxide stoichiometry effects on reversible switching and program window optimization J. Appl. Phys. 116, 043708 (2014); 10.1063/1.4891242Effect of current compliance and voltage sweep rate on the resistive switching of HfO2/ITO/Invar structure as measured by conductive atomic force microscopy Appl. Phys. Lett.The Ag/SiO 2 /indium tin oxide (ITO) devices exhibit bipolar resistive switching with a large memory window of $10 2 , satisfactory endurance of >500 cycles, good retention property of >2000 s, and fast operation speed of <100 ns, thus being a type of promising resistive memory. Under slow voltage sweep measurements, conductance plateaus with a conductance value of integer or half-integer multiples of single atomic point contact have been observed, which agree well with the physical phenomenon of conductance quantization. More importantly, the Ag/SiO 2 / ITO devices exhibit more distinct quantized conductance plateaus under pulse measurements, thereby showing the potential for realizing ultra-high storage density. V C 2014 AIP Publishing LLC.