2012
DOI: 10.1021/nn301850g
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Conductance Statistics from a Large Array of Sub-10 nm Molecular Junctions

Abstract: Devices made of few molecules constitute the miniaturization limit that both inorganic and organic-based electronics aspire to reach. However, integration of millions of molecular junctions with less than 100 molecules each has been a long technological challenge requiring well controlled nanometric electrodes. Here we report molecular junctions fabricated on a large array of sub-10 nm single crystal Au nanodots electrodes, a new approach that allows us to measure the conductance of up to a million of junction… Show more

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Cited by 45 publications
(93 citation statements)
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References 46 publications
(161 reference statements)
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“…19,[35][36][37] Figure 3 (inset) shows the distribution of conductance, G ¼ dJ/dV, values measured in reverse bias (0 V) and forward bias (þ1 V) regimes, for fresh C 12 junctions prepared in nominally identical conditions. The average values and typical distribution over one decade found for G (rev.)…”
Section: B DC Electrical Transportmentioning
confidence: 99%
See 1 more Smart Citation
“…19,[35][36][37] Figure 3 (inset) shows the distribution of conductance, G ¼ dJ/dV, values measured in reverse bias (0 V) and forward bias (þ1 V) regimes, for fresh C 12 junctions prepared in nominally identical conditions. The average values and typical distribution over one decade found for G (rev.)…”
Section: B DC Electrical Transportmentioning
confidence: 99%
“…49 As a consequence, a large dispersion in electrical properties of the corresponding devices is expected and has been observed. 19,[35][36][37] In the particular case of macroscopic a)…”
mentioning
confidence: 99%
“…[10][11][12][13][14][15] However, besides the problem of engineering a homogeneous and reliable top electrode in contact with a nanometer-thick molecular monolayer, a major issue in hybrid molecular-silicon junctions is the structural disorder which results from the irreversible grafting mechanism related to the strong covalent bonding ; hence structural disorder probably induces some distribution of barrier heights for electrical transport and may explain the wide range of conductance values observed experimentally. 16,17 In metal / semiconductor (SC) junctions, the presence of interface states and of a thin insulating layer have been recognized as non idealizing factors in the current-voltage (I-V) characteristics. [18][19][20][21] A number of methods based on non-stationary measurements have been developed for interface defect characterization in thick MIS diodes 22,23 and tentatively extended to MIS junctions with interfacial layers, 24,25 ultrathin SiO 2 , 19,26-29 and molecular insulator.…”
Section: Introductionmentioning
confidence: 99%
“…Micro-and nano-scale patterning of biomolecules onto solid-state surfaces in a controlled manner has proven its applicability in several fields of science and technology, the most important being nanoelectronics [1], information storage devices [2], catalysis [3], and sensing [4]. Architectures at small scale can be fabricated using various techniques such as optical, imprint, scanning probe, or soft lithographies [5].…”
Section: Introductionmentioning
confidence: 99%