Confocal microscopy with a radially polarized focused beam

Meng, Peiwen; Pereira, Silvania F.; Urbach, Paul

doi:10.1364/oe.26.029600

Cited by 27 publications

(11 citation statements)

References 28 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…The small sphere with a radius a, which should be smaller than the trapping wavelength can be regarded as an electric dipole. The dipole moment is p = αE [40][41][42][43], where α is the electric polarizability given by…”

Section: Optical Torque Of Particles In Focused Cvv Fieldsmentioning

confidence: 99%

Angular momentum properties of hybrid cylindrical vector vortex beams in tightly focused optical systems

et al. 2019

Self Cite

View full text Add to dashboard Cite

Optical angular momenta (AM) have attracted tremendous research interest in recent years. In this paper we theoretically investigate the electromagnetic field and angular momentum properties of tightly focused arbitrary cylindrical vortex vector (CVV) input beams. An absorptive particle is placed in focused CVV fields to analyze the optical torques. The spin-orbit motions of the particle can be predicted and controlled when the influences of different parameters, such as the topological charge, the polarization and the initial phases, are taken into account. These findings will be helpful in optical beam shaping, optical spin-orbit interaction and practical optical manipulation.

show abstract

Section: Optical Torque Of Particles In Focused Cvv Fieldsmentioning

confidence: 99%

Angular momentum properties of hybrid cylindrical vector vortex beams in tightly focused optical systems

et al. 2019

Self Cite

View full text Add to dashboard Cite

show abstract

“…This feature of RP beam enables it to generate a smaller focusing spot than linearly polarized or circularly polarized light. Therefore, the tightly focused RP beam can be widely used in microscopic imaging [34], optical trapping [35], and laser machining [36]. How to completely characterize this kind of light field is crucial to developing these applications.…”

Section: Resultsmentioning

confidence: 99%

Mie Scattering Nanointerferometry for the Reconstruction of Tightly Focused Vector Fields by Polarization Decomposition

Yang

Gao

et al. 2023

Photonics

View full text Add to dashboard Cite

Tightly focused vector fields, which can be generated by focusing a light beam through a high-numerical-aperture objective, play an important role in nano-optics research. How to fully characterize this kind of field in the subwavelength scale is a challenging but important task. The Mie scattering nanointerferometry technique has been proposed to reconstruct the tightly focused vector field accurately. In this work, we theoretically demonstrate that the technique can be realized by collecting the transmitted light with two orthogonal polarization states simultaneously. Therefore, when nanoparticles are employed to scan the fields to be measured, more information of the scattering field can be acquired in the far field. This is helpful for solving the linear inverse scattering problem by reducing the number of scanning points, thus making the measurement more efficient.

show abstract

“…It is proposed that vectorial-field-modulated light is effective in generating a focal spot with an FWHM beyond the diffraction limit [17][18][19][20][21], which can be implemented into a confocal laser scanning microscopic (CLSM) configuration to achieve label-free superresolution imaging [22][23][24][25][26] and storage [27,28]. While researchers endeavor to narrow the focal spot, a fundamental question remains if the light may be blocked from entering the nanostructures medium no matter how small the interacting light field is, as the optical properties rather than the actual morphology of complex photonics or plasmonic structures do really support the concentrated excitations.…”

Section: Introductionmentioning

confidence: 99%

Far-Field and Non-Intrusive Optical Mapping of Nanoscale Structures

et al. 2022

View full text Add to dashboard Cite

Far-field high-density optics storage and readout involve the interaction of a sub-100 nm beam profile laser to store and retrieve data with nanostructure media. Hence, understanding the light–matter interaction responding in the far-field in such a small scale is essential for effective optical information processing. We present a theoretical analysis and an experimental study for far-field and non-intrusive optical mapping of nanostructures. By a comprehensive analytical derivation for interaction between the modulated light and the target in a confocal laser scanning microscopy (CLSM) configuration, it is found that the CLSM probes the local density of states (LDOSs) in the far field rather than the sample geometric morphology. With a radially polarized (RP) light for illumination, the far-field mapping of LDOS at the optical resolution down to 74 nm is obtained. In addition, it is experimentally verified that the target morphology is mapped only when the far-field mapping of LDOS coincides with the geometric morphology, while light may be blocked from entering the nanostructures medium with weak or missing LDOS, hence invalidating high-density optical information storage and retrieval. In this scenario, nanosphere gaps as small as 33 nm are clearly observed. We further discuss the characterization for far-field and non-intrusive interaction with nanostructures of different geometric morphology and compare them with those obtainable with the projection of near-field LDOS and scanning electronic microscopic results.

show abstract

Confocal microscopy with a radially polarized focused beam

Cited by 27 publications

References 28 publications

Angular momentum properties of hybrid cylindrical vector vortex beams in tightly focused optical systems

Angular momentum properties of hybrid cylindrical vector vortex beams in tightly focused optical systems

Mie Scattering Nanointerferometry for the Reconstruction of Tightly Focused Vector Fields by Polarization Decomposition

Far-Field and Non-Intrusive Optical Mapping of Nanoscale Structures

Contact Info

Product

Resources

About