2021
DOI: 10.1021/acsanm.0c02820
|View full text |Cite
|
Sign up to set email alerts
|

Conformal Growth of Nanometer-Thick Transition Metal Dichalcogenide TiSx-NbSx Heterostructures over 3D Substrates by Atomic Layer Deposition: Implications for Device Fabrication

Abstract: The scalable and conformal synthesis of two-dimensional (2D) transition metal dichalcogenide (TMDC) heterostructures is a persisting challenge for their implementation in next-generation devices. In this work, we report the synthesis of nanometer-thick 2D TMDC heterostructures consisting of TiS x -NbS x on both planar and 3D structures using atomic layer deposition (ALD) at low temperatures (200–300 °C). To this end, a process was developed for the growth o… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1

Citation Types

0
16
0

Year Published

2021
2021
2023
2023

Publication Types

Select...
6
1

Relationship

1
6

Authors

Journals

citations
Cited by 11 publications
(16 citation statements)
references
References 37 publications
0
16
0
Order By: Relevance
“…A thermal TiS x recipe was also used for comparison. 80 Film Characterization. Film thickness was monitored during depositions using in situ spectroscopic ellipsometry (SE).…”
Section: Chemistry Of Materials Pubsacsorg/cm Articlementioning
confidence: 99%
“…A thermal TiS x recipe was also used for comparison. 80 Film Characterization. Film thickness was monitored during depositions using in situ spectroscopic ellipsometry (SE).…”
Section: Chemistry Of Materials Pubsacsorg/cm Articlementioning
confidence: 99%
“…The research demonstrated a large area uniformity and conformality of the ALD heterostructures implying applications in nanoelectronics with 3D structures and high aspect ratios. 148 A low-temperature ALD of MoS 2 thin film was investigated by Jurca et al 149 This research was triggered by the high reactivity of Mo(NMe 2 ) 4 as revealed by wet chemical screening. The growth of amorphous MoS 2 film was possible at as low as 60 °C with a growth rate of 1.2 Å/cycle.…”
Section: Metalmentioning
confidence: 99%
“…[114,145,152,213] In addition to the conventional thermal evaporation, electron beam deposition or magnetron sputtering, [125,[214][215][216][217] ALD affords atomic film thickness precision control of the deposited film, benefiting the following reaction with chalcogens. [117,[218][219][220] Tan et al used ALD to deposit MoCl 5 film and sulfurize it with H 2 S to generate 5.08 cm (2 in.) continuous film.…”
Section: Layer Numbermentioning
confidence: 99%
“…[114,145,152,213] In addition to the conventional thermal evaporation, electron beam deposition or magnetron sputtering, [125,[214][215][216][217] atomic layer deposition (ALD) affords atomic film thickness precision control of the deposited film, benefiting the following reaction with chalcogens. [117,[218][219][220] it with H 2 S to generate 5.08 cm (2-inch) continuous film. [140] ALD provides a route to tune the layer number of the product through deposition cycles (Figure 12c).…”
Section: Layer Numbermentioning
confidence: 99%