Construct a Total Safety Performance for Semiconductor Industry

Abstract

By referring to the approaches of a safety performance evaluation and the corresponding aspects developed in past studies and also adopting the management mechanisms suggested in the Taiwan Occupational Safety and Health System guidelines, this study constructs the "Total Safety Performance Evaluation Method." and a safety performance questionnaire is designed by utilizing a semiconductor business in Taiwan as the subject to understand the current status of safety performance in the semiconductor industry by a statistical analysis of the outcome of the questionnaire survey.The outcome reveals that the employees of the semiconductor business consider that the safety performance evaluation conducted for the elements of "worker participation," "risk assessment," "procurement management," "work permission," and "safety protection" is not well executed; however, it is well executed for the elements of, in descending order, "health examination," "emergency response," "safety audit," and "management of hazardous substances." The answers given in the questionnaire indicate that the employees are not enthusiastic about participating in safety promotion activities but confirm that the company conducts health examination on a regular basis.

Unveiling localized electronic properties of ReS2 thin layers at nanoscale using Kelvin force probe microscopy combined with tip-enhanced Raman spectroscopy

“…, where E c (E v ) and m dp (m de ) are the energies of conduction band minima (valence band maxima) and effective mass of hole (electron) at the Γ point of the first Bril-louin zone. [44] According to the previous reports, [45,46] E c , E v , m dp and m de are all dependent on the loaded strain. Detailed quantitative analysis of the V-shape relationship between E f and strain needs to further consider the in-plane anisotropic electronic properties, which is still ongoing and will be reported in the near future.…”