2012
DOI: 10.1016/j.jsv.2012.07.014
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Contact dynamics of tapping mode atomic force microscopy

Abstract: a b s t r a c tA comprehensive model on the dynamics of a tilted tapping mode atomic force microscopy (AFM) is presented, which includes the multimodal analysis, mode coupling mechanisms, adhesion, contact and friction forces induced by the tilting angle. A displacement criterion of contact/impact is proposed to eliminate the assumptions of the previous models such as infinite stiffness of sample or zero impact velocity, which makes the model presented here suitable for more general AFM application scenario, e… Show more

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Cited by 12 publications
(2 citation statements)
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“…Under conditions where the tip starts tapping the surface, the linearity of the amplitude signal in response to V AC and/or V CPD may be disrupted leading to artefacts in the measurements. For multifrequency techniques, this nonlinear motion of the cantilever due to tapping the surface can induce motion of the lever at higher harmonics and distort the frequency response characteristics of the system [104][105][106].…”
Section: Influence Of Capacitance Gradient and Amplitudementioning
confidence: 99%
“…Under conditions where the tip starts tapping the surface, the linearity of the amplitude signal in response to V AC and/or V CPD may be disrupted leading to artefacts in the measurements. For multifrequency techniques, this nonlinear motion of the cantilever due to tapping the surface can induce motion of the lever at higher harmonics and distort the frequency response characteristics of the system [104][105][106].…”
Section: Influence Of Capacitance Gradient and Amplitudementioning
confidence: 99%
“…Zhang et al . (2012) studied about the nonlinear dynamics behaviour of a rectangular AFM cantilever by considering DMT contact theory for modelling the tip–sample interaction force. In their analysis, all related details about the cantilever and sample surface has been considered.…”
Section: Introductionmentioning
confidence: 99%