2014
DOI: 10.1063/1.4905015
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Contact resistance and overlapping capacitance in flexible sub-micron long oxide thin-film transistors for above 100 MHz operation

Abstract: (2014) Contact resistance and overlapping capacitance in flexible sub-micron long oxide thin-film transistors for above 100 MHz operation. Applied Physics Letters, 105 (26).

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Cited by 63 publications
(74 citation statements)
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“…Both, the MSG and GTU measurements show the expected behavior, namely a decrease of f max in longer TFTs. This is also in line with corresponding transit frequency measurements [12]. In particular the GTU measurement also exhibits larger error bars at smaller frequencies.…”
Section: B Unity Power Gain Frequencysupporting
confidence: 76%
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“…Both, the MSG and GTU measurements show the expected behavior, namely a decrease of f max in longer TFTs. This is also in line with corresponding transit frequency measurements [12]. In particular the GTU measurement also exhibits larger error bars at smaller frequencies.…”
Section: B Unity Power Gain Frequencysupporting
confidence: 76%
“…However, it has to be mentioned that due to the extremely short channel some of the parameters are deteriorated. In particular the effective mobility is reduced by a contact resistances of 12 Ω cm (same order of magnitude as the channel resistance) [12]. Simultaneously, the output resistance is only ≈5.5 kΩ (V GS =2 V).…”
Section: A DC Transistor Performancementioning
confidence: 86%
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“…Controlling the contact resistance is especially important in short-channel devices (L Շ 5 lm), since a high R C value can lead to the degradation of both the device l FE and f T . 105,106 In a TFT, the contact resistance depends on the source/drain electrodes, 107,108 the interface metal/semiconductor, 107 the source/drain to gate contact area, 106,108 as well as specific contact treatments (plasma, temperature, etc.) performed.…”
Section: =2mentioning
confidence: 99%