2017
DOI: 10.1134/s1063782617110161
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Contactless characterization of manganese and carbon delta-layers in gallium arsenide

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Cited by 4 publications
(2 citation statements)
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“…This fact (the carrier concentration increase as the result of ion irradiation) is unusual for GaAs moderately doped with a shallow impurity and therefore requires an explanation. These results are consistent with the suggestion that in structures with the Mn δ-layer the formation of the Mn impurity band occurs [23]. Moreover, the results can be analyzed under the assumption that the transport properties of the structures are determined by two conduction channels (IB and VB).…”
Section: Methodssupporting
confidence: 89%
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“…This fact (the carrier concentration increase as the result of ion irradiation) is unusual for GaAs moderately doped with a shallow impurity and therefore requires an explanation. These results are consistent with the suggestion that in structures with the Mn δ-layer the formation of the Mn impurity band occurs [23]. Moreover, the results can be analyzed under the assumption that the transport properties of the structures are determined by two conduction channels (IB and VB).…”
Section: Methodssupporting
confidence: 89%
“…As the reference value of the sheet concentration p VB at 295 K, the p VB value for the reference structure with the carbon δ-layer was taken (p VB ~ 10 12 cm -2 , the structure 7669 in [23]), since this structure has the built-in electric field (≈ 36 kV/cm) comparable with that of the structure with Mn δ-layer (≈ 23 kV/cm) [23,25]. As the reference values of the hole mobility μ VB the corresponding experimental values obtained for the other reference structure (uniformly Mn doped GaAs layer) were used.…”
Section: Transport Propertiesmentioning
confidence: 99%