2018
DOI: 10.20944/preprints201811.0522.v1
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Contactless In-Situ Electrical Characterization Method of Printed Electronic Devices with Terahertz Spectroscopy

Abstract: Printed electronic devices are attracting significant interest due to their versatility and low cost; however, quality control during manufacturing is a significant challenge preventing the widespread adoption of this promising technology. We show that terahertz radiation can be used for the in-situ inspection of printed electronic devices, as confirmed through a comparison with conventional electrical conductivity methods. Our in-situ method consists in printing a simple test pattern exhibiting a distinct sig… Show more

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Cited by 1 publication
(6 citation statements)
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“…Generally, changing the geometrical specifications represents a way to tune and determine whether the EM wave is transmitted, reflected, or absorbed 25 . Here, the designed MCBs behave as frequency selective filters, where an incident wavelength is approximately equal to one of the main dimensions of the unit cell (patch or voids), as well as to the lattice of the structure 13 . Based on the geometrical parameters of our designed patterns, we should have a maximum THz transmission for the i-MCB of around fΔd i-MCB = 0.22 THz, which corresponds to the size of the laps, and the first minimum THz transmission at fp i-MCB = 0.30 THz, which contains the lattice information.…”
Section: Thz Approachmentioning
confidence: 99%
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“…Generally, changing the geometrical specifications represents a way to tune and determine whether the EM wave is transmitted, reflected, or absorbed 25 . Here, the designed MCBs behave as frequency selective filters, where an incident wavelength is approximately equal to one of the main dimensions of the unit cell (patch or voids), as well as to the lattice of the structure 13 . Based on the geometrical parameters of our designed patterns, we should have a maximum THz transmission for the i-MCB of around fΔd i-MCB = 0.22 THz, which corresponds to the size of the laps, and the first minimum THz transmission at fp i-MCB = 0.30 THz, which contains the lattice information.…”
Section: Thz Approachmentioning
confidence: 99%
“…The PCA emitter and detector were placed in front of each other and a high resistivity hyper hemispherical silicon lens, located at the back of the emitter and detector, were used for fine alignment of the THz beam. To improve the dynamic range, the PCA detector was connected to a current amplifier (SR-5235) and a standard lock-in detection (SR-830) was performed with a mechanical chopper set at 330 Hz 13 . The samples were placed between the mechanical chopper and the PCA detector at a normal incidence of vertically polarized THz pulses with a peak frequency of 0.2 THz (see Supplementary Fig.…”
Section: Characterization Techniquesmentioning
confidence: 99%
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