Continuous Fluorescence Correction in Electron Probe Microanalysis Applying an Electron Scattering Model

Pfeiffer, Arnold; Schiebl, Christian; Wernisch, J.

doi:10.1002/(sici)1097-4539(199605)25:3<131::aid-xrs150>3.3.co;2-s

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“…4 since the simulations underestimate the real -ratio. The continuum excited fluorescence appears for both A and B (and it can be clearly observed with a logarithmic scale on WDS measurements) and can be reasonably simulated by a point source approximation [20,22,24,27] or with a 2D distribution function based on the use of the depth distribution function for the continuous radiation [28,29]. Lastly, the continuum fluorescence is of the same order as the Ã ¬ characteristic fluorescence for diffusion couples such as Ni/Cu or Ni/Zn with ¼ ¾ Î [24].…”

Section: Simplified Concentration Gradient and Validationsmentioning

confidence: 99%

EPMA Measurements of Diffusion Profiles at the Submicrometre Scale

Hild

2002

Microchimica Acta

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International audienceConcentration profiles due to (inter)diffusion in materials may require high spatial resolution. These profiles may be measured by electron probe microanalysis, which allows one to determine the elemental composition with a good accuracy provided measurement ‘artefacts' can be accounted for. Standard phenomena are usually corrected by commercial softwares that assume a homogeneous elemental composition in the analysed area. However, in the case of a diffusion process on a small scale, the composition is no longer homogeneous and the effect of the hemispherical volume of the Xray emission on the spatial resolution of the concentration profiles, and consequently on the diffusion coefficients, has to be considered. Moreover, (secondary) fluorescence across interfaces or interphases has to be evaluated. A radial X-ray distribution associated with the characteristic depth distribution allows for the definition of a 2D X-ray emission function that enables the computation of the entire process for a given concentration profile

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Section: Simplified Concentration Gradient and Validationsmentioning

confidence: 99%

EPMA Measurements of Diffusion Profiles at the Submicrometre Scale

Hild

2002

Microchimica Acta

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show abstract

Continuous Fluorescence Correction in Electron Probe Microanalysis Applying an Electron Scattering Model

Cited by 1 publication

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EPMA Measurements of Diffusion Profiles at the Submicrometre Scale

EPMA Measurements of Diffusion Profiles at the Submicrometre Scale

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