1987
DOI: 10.1063/1.98668
|View full text |Cite
|
Sign up to set email alerts
|

Contrast enhancement pattern transfer etching of phosphorus-doped polycrystalline silicon

Abstract: Pattern transfer etching of heavily phosphorus-doped polycrystalline silicon has been developed using a KrF excimer laser through a 1:1 reflective optics and a new contrast enhancement scheme employing methylmethacrylate. With laser power at more than 0.5 mJ/cm2 and Cl2 gas as etchant, etching of n+ poly-Si proceeded in the illuminated (bright) region, while the dark region was protected from etching by a polymer film formed from methylmethacrylate. As a result, a 0.9-μm resolution pattern has been achieved.

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1

Citation Types

0
2
0

Year Published

1987
1987
2010
2010

Publication Types

Select...
2
1

Relationship

0
3

Authors

Journals

citations
Cited by 3 publications
(2 citation statements)
references
References 5 publications
0
2
0
Order By: Relevance
“…Silicon Etching [5) Phosphorous doped N-type silicon (-5 x 10(15)/cc) was stripped of its oxide by dipping in a buffered HF solution for 20 sec prior to placing in the vacuum cell.…”
Section: Polyimide Ablationmentioning
confidence: 99%
See 1 more Smart Citation
“…Silicon Etching [5) Phosphorous doped N-type silicon (-5 x 10(15)/cc) was stripped of its oxide by dipping in a buffered HF solution for 20 sec prior to placing in the vacuum cell.…”
Section: Polyimide Ablationmentioning
confidence: 99%
“…While most of the recent activity in excimer laser exposure instruments has been for photolithographic applications [1,2], reports dealing with projection etching have appeared [3,4,5].…”
Section: Introductionmentioning
confidence: 99%