Contrast Mechanisms in the Thermoacoustic Microscope

Favro, L. D.; Kuo, P. K.; Thomas, R. L.

doi:10.1007/978-1-4615-7763-8_45

Cited by 2 publications

(1 citation statement)

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“…In general, however, the thermal diffusion length governs the resolution in most materials (see table 2). The resolution therefore depends on w -' / ~ and this has been verified experimentally over a wide frequency range in CuZnAl alloy Recently, Favro and co-workers [16,19,20] have examined several ways in which the thermal and acoustic waves produced by the incident heat and/or momentum source mode-convert into acoustic waves.…”

Section: Thermal Couplingmentioning

confidence: 84%

Signal production in scanning electron acoustic microscopy

Rocca

Davies

1989

J. Phys. D: Appl. Phys.

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We have studied the variation of the electron acoustic signal in various materials as a function of the beam accelerating voltage and current. The results show that in most materials examined, e.g. copper, CuZnAl alloy and silicon, it is only the total incident beam power which determines the magnitude of the electron acoustic signal produced. In compensated GaAs the electron acoustic signal depends only on the beam current and is independent of the accelerating voltage which is unlike the case for highly doped GaAs which resembles the metals and silicon. Both semi-insulating and highly doped InP behave as the highly doped GaAs sample. The results are discussed in relation to some of the signal generation mechanisms thought to operate in the electron acoustic (or thermal wave) microscope.

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Section: Thermal Couplingmentioning

confidence: 84%